A text teaching graduate students the concepts of transmission electron microscopy and x-ray diffractometry used for the characterization of materials. Dicusses important themes such as wave coherence, conventional imaging, and the formation and analysis of diffraction patterns. Also discusses the unique characteristics of each technique.
"synopsis" may belong to another edition of this title.
Seller: Studibuch, Stuttgart, Germany
hardcover. Condition: Befriedigend. 767 Seiten; 9783540678410.4 Gewicht in Gramm: 2. Seller Inventory # 909460
Quantity: 1 available