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Transmission Electron Microscopy and Diffractometry of Materials - Hardcover

James M. Howe

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9783540678410: Transmission Electron Microscopy and Diffractometry of Materials

Synopsis

A text teaching graduate students the concepts of transmission electron microscopy and x-ray diffractometry used for the characterization of materials. Dicusses important themes such as wave coherence, conventional imaging, and the formation and analysis of diffraction patterns. Also discusses the unique characteristics of each technique.

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