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Synopsis
A text teaching graduate students the concepts of transmission electron microscopy and x-ray diffractometry used for the characterization of materials. Dicusses important themes such as wave coherence, conventional imaging, and the formation and analysis of diffraction patterns. Also discusses the unique characteristics of each technique.
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- PublisherSpringer
- Publication date2001
- ISBN 10 3540678417
- ISBN 13 9783540678410
- BindingHardcover
- LanguageEnglish
- Edition number1
- Number of pages748
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Transmission Electron Microscopy and Diffractometry of Materials
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Transmission Electron Microscopy and Diffractometry of Materials
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Transmission Electron Microscopy and Diffractometry of Materials
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Transmission Electron Microscopy and Diffractometry of Materials
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