X-Ray Fluorescence Spectroscopy: Using the Pixel Semiconductor Detector TimePix

 
9783659235054: X-Ray Fluorescence Spectroscopy: Using the Pixel Semiconductor Detector TimePix

X-ray fluorescence spectroscopy (XRF) is a non-destructive and fast technique that allows knowing the elemental composition of a sample thanks to the emission of characteristic X-rays in that sample. The TimePix pixel semiconductor detector can detect these characteristic X-rays and tell the energy of the incoming photons in each pixel. This permits to make a spatial characterization of the sample, besides the elemental characterization. This work explores X-ray fluorescence spectroscopy with the use of TimePix with the purpose of characterizing the spectra of two samples and spatially characterize a sample consisting those elements. It was possible to obtain different spectra for both elements with the device by the use of a threshold scan method, as well as to know which region of the sample consisted of which element by superpixel analysis of the count pixel matrix given by the TimePix device. The work first presents a short introduction to XRF spectroscopy in general and using TimePix. Then it presents the theoretical basis needed and finally it exposes the experimental procedures followed and their results. In the last chapter, conclusions and future work are given.

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About the Author:

Juliana Sandoval Navia was born in Bogotá, Colombia, in 1989. She is a physicist with a minor in Education from Universidad de los Andes in Bogotá, and has a graduate major in Curriculum and Pedagogy from the same university. Her actual interests are in applied physics, in which she wants to pursue her graduate studies.

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Book Description Book Condition: New. Publisher/Verlag: LAP Lambert Academic Publishing | Using the Pixel Semiconductor Detector TimePix | X-ray fluorescence spectroscopy (XRF) is a non-destructive and fast technique that allows knowing the elemental composition of a sample thanks to the emission of characteristic X-rays in that sample. The TimePix pixel semiconductor detector can detect these characteristic X-rays and tell the energy of the incoming photons in each pixel. This permits to make a spatial characterization of the sample, besides the elemental characterization. This work explores X-ray fluorescence spectroscopy with the use of TimePix with the purpose of characterizing the spectra of two samples and spatially characterize a sample consisting those elements. It was possible to obtain different spectra for both elements with the device by the use of a threshold scan method, as well as to know which region of the sample consisted of which element by superpixel analysis of the count pixel matrix given by the TimePix device. The work first presents a short introduction to XRF spectroscopy in general and using TimePix. Then it presents the theoretical basis needed and finally it exposes the experimental procedures followed and their results. In the last chapter, conclusions and future work are given. | Format: Paperback | Language/Sprache: english | 152 pp. Bookseller Inventory # K9783659235054

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Juliana Sandoval Navia
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Book Description LAP Lambert Academic Publishing Sep 2012, 2012. Taschenbuch. Book Condition: Neu. Neuware - X-ray fluorescence spectroscopy (XRF) is a non-destructive and fast technique that allows knowing the elemental composition of a sample thanks to the emission of characteristic X-rays in that sample. The TimePix pixel semiconductor detector can detect these characteristic X-rays and tell the energy of the incoming photons in each pixel. This permits to make a spatial characterization of the sample, besides the elemental characterization. This work explores X-ray fluorescence spectroscopy with the use of TimePix with the purpose of characterizing the spectra of two samples and spatially characterize a sample consisting those elements. It was possible to obtain different spectra for both elements with the device by the use of a threshold scan method, as well as to know which region of the sample consisted of which element by superpixel analysis of the count pixel matrix given by the TimePix device. The work first presents a short introduction to XRF spectroscopy in general and using TimePix. Then it presents the theoretical basis needed and finally it exposes the experimental procedures followed and their results. In the last chapter, conclusions and future work are given. 152 pp. Englisch. Bookseller Inventory # 9783659235054

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Juliana Sandoval Navia
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Book Description LAP Lambert Academic Publishing Sep 2012, 2012. Taschenbuch. Book Condition: Neu. Neuware - X-ray fluorescence spectroscopy (XRF) is a non-destructive and fast technique that allows knowing the elemental composition of a sample thanks to the emission of characteristic X-rays in that sample. The TimePix pixel semiconductor detector can detect these characteristic X-rays and tell the energy of the incoming photons in each pixel. This permits to make a spatial characterization of the sample, besides the elemental characterization. This work explores X-ray fluorescence spectroscopy with the use of TimePix with the purpose of characterizing the spectra of two samples and spatially characterize a sample consisting those elements. It was possible to obtain different spectra for both elements with the device by the use of a threshold scan method, as well as to know which region of the sample consisted of which element by superpixel analysis of the count pixel matrix given by the TimePix device. The work first presents a short introduction to XRF spectroscopy in general and using TimePix. Then it presents the theoretical basis needed and finally it exposes the experimental procedures followed and their results. In the last chapter, conclusions and future work are given. 152 pp. Englisch. Bookseller Inventory # 9783659235054

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Book Description LAP Lambert Academic Publishing Sep 2012, 2012. Taschenbuch. Book Condition: Neu. This item is printed on demand - Print on Demand Neuware - X-ray fluorescence spectroscopy (XRF) is a non-destructive and fast technique that allows knowing the elemental composition of a sample thanks to the emission of characteristic X-rays in that sample. The TimePix pixel semiconductor detector can detect these characteristic X-rays and tell the energy of the incoming photons in each pixel. This permits to make a spatial characterization of the sample, besides the elemental characterization. This work explores X-ray fluorescence spectroscopy with the use of TimePix with the purpose of characterizing the spectra of two samples and spatially characterize a sample consisting those elements. It was possible to obtain different spectra for both elements with the device by the use of a threshold scan method, as well as to know which region of the sample consisted of which element by superpixel analysis of the count pixel matrix given by the TimePix device. The work first presents a short introduction to XRF spectroscopy in general and using TimePix. Then it presents the theoretical basis needed and finally it exposes the experimental procedures followed and their results. In the last chapter, conclusions and future work are given. 152 pp. Englisch. Bookseller Inventory # 9783659235054

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Book Description LAP Lambert Academic Publishing, 2012. Paperback. Book Condition: New. Language: English . Brand New Book. X-ray fluorescence spectroscopy (XRF) is a non-destructive and fast technique that allows knowing the elemental composition of a sample thanks to the emission of characteristic X-rays in that sample. The TimePix pixel semiconductor detector can detect these characteristic X-rays and tell the energy of the incoming photons in each pixel. This permits to make a spatial characterization of the sample, besides the elemental characterization. This work explores X-ray fluorescence spectroscopy with the use of TimePix with the purpose of characterizing the spectra of two samples and spatially characterize a sample consisting those elements. It was possible to obtain different spectra for both elements with the device by the use of a threshold scan method, as well as to know which region of the sample consisted of which element by superpixel analysis of the count pixel matrix given by the TimePix device. The work first presents a short introduction to XRF spectroscopy in general and using TimePix. Then it presents the theoretical basis needed and finally it exposes the experimental procedures followed and their results. In the last chapter, conclusions and future work are given. Bookseller Inventory # KNV9783659235054

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