Ankush Chunn CMOS Sample and Hold Circuits

ISBN 13: 9783659380709

CMOS Sample and Hold Circuits

 
9783659380709: CMOS Sample and Hold Circuits
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Open-loop sample and hold topologies generally provide the fastest implementation of the sampling function. However, the precision obtained with such configurations is typically much lower than can be achieved with alternative closed-loop architecture. In design where an MOS transistor is used as sampling switch, input-dependent charge associated with the fast turn-off of the switch is often the principal source of sampling error. This charge injection introduces a pedestal error, in the hold mode that results in both nonlinearity and gain error. Since the resistance of switch is nonlinear as the input voltage varies, a nonlinear voltage appears at the output of the switch. To minimize the magnitude of distortion terms, the resistance is linearized and reduced. By appropriately sizing the device, a compromise can be reached between the size of switch resistance and hold capacitance. This book bringsforth the non-linearities associated with a sampling switch along with different design criteria viz. speed, power, resolution, linearity, noise and harmonic analysis.

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About the Author:

Mr. Ankush Chunn received his B.Tech degree from University of Jammu in 2006 and M.Tech degree from NIT Hamirpur in 2009. Currently, He is pursuing PhD in Department of ECE, NIT Jalandhar. His current areas of research are Mixed signal VLSI Design. He has published several conference and journals papers in this domain.

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Book Description Condition: New. Publisher/Verlag: LAP Lambert Academic Publishing | Open-loop sample and hold topologies generally provide the fastest implementation of the sampling function. However, the precision obtained with such configurations is typically much lower than can be achieved with alternative closed-loop architecture. In design where an MOS transistor is used as sampling switch, input-dependent charge associated with the fast turn-off of the switch is often the principal source of sampling error. This charge injection introduces a pedestal error, in the hold mode that results in both nonlinearity and gain error. Since the resistance of switch is nonlinear as the input voltage varies, a nonlinear voltage appears at the output of the switch. To minimize the magnitude of distortion terms, the resistance is linearized and reduced. By appropriately sizing the device, a compromise can be reached between the size of switch resistance and hold capacitance. This book bringsforth the non-linearities associated with a sampling switch along with different design criteria viz. speed, power, resolution, linearity, noise and harmonic analysis. | Format: Paperback | Language/Sprache: english | 160 gr | 220x150x6 mm | 108 pp. Seller Inventory # K9783659380709

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Book Description LAP Lambert Academic Publishing Mai 2013, 2013. Taschenbuch. Condition: Neu. Neuware - Open-loop sample and hold topologies generally provide the fastest implementation of the sampling function. However, the precision obtained with such configurations is typically much lower than can be achieved with alternative closed-loop architecture. In design where an MOS transistor is used as sampling switch, input-dependent charge associated with the fast turn-off of the switch is often the principal source of sampling error. This charge injection introduces a pedestal error, in the hold mode that results in both nonlinearity and gain error. Since the resistance of switch is nonlinear as the input voltage varies, a nonlinear voltage appears at the output of the switch. To minimize the magnitude of distortion terms, the resistance is linearized and reduced. By appropriately sizing the device, a compromise can be reached between the size of switch resistance and hold capacitance. This book bringsforth the non-linearities associated with a sampling switch along with different design criteria viz. speed, power, resolution, linearity, noise and harmonic analysis. 108 pp. Englisch. Seller Inventory # 9783659380709

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Book Description LAP Lambert Academic Publishing Mai 2013, 2013. Taschenbuch. Condition: Neu. Neuware - Open-loop sample and hold topologies generally provide the fastest implementation of the sampling function. However, the precision obtained with such configurations is typically much lower than can be achieved with alternative closed-loop architecture. In design where an MOS transistor is used as sampling switch, input-dependent charge associated with the fast turn-off of the switch is often the principal source of sampling error. This charge injection introduces a pedestal error, in the hold mode that results in both nonlinearity and gain error. Since the resistance of switch is nonlinear as the input voltage varies, a nonlinear voltage appears at the output of the switch. To minimize the magnitude of distortion terms, the resistance is linearized and reduced. By appropriately sizing the device, a compromise can be reached between the size of switch resistance and hold capacitance. This book bringsforth the non-linearities associated with a sampling switch along with different design criteria viz. speed, power, resolution, linearity, noise and harmonic analysis. 108 pp. Englisch. Seller Inventory # 9783659380709

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Book Description LAP LAMBERT Academic Publishing. Paperback. Condition: New. 108 pages. Dimensions: 8.7in. x 5.9in. x 0.2in.Open-loop sample and hold topologies generally provide the fastest implementation of the sampling function. However, the precision obtained with such configurations is typically much lower than can be achieved with alternative closed-loop architecture. In design where an MOS transistor is used as sampling switch, input-dependent charge associated with the fast turn-off of the switch is often the principal source of sampling error. This charge injection introduces a pedestal error, in the hold mode that results in both nonlinearity and gain error. Since the resistance of switch is nonlinear as the input voltage varies, a nonlinear voltage appears at the output of the switch. To minimize the magnitude of distortion terms, the resistance is linearized and reduced. By appropriately sizing the device, a compromise can be reached between the size of switch resistance and hold capacitance. This book bringsforth the non-linearities associated with a sampling switch along with different design criteria viz. speed, power, resolution, linearity, noise and harmonic analysis. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. Seller Inventory # 9783659380709

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Book Description LAP Lambert Academic Publishing, United States, 2013. Paperback. Condition: New. Language: English . Brand New Book ***** Print on Demand *****.Open-loop sample and hold topologies generally provide the fastest implementation of the sampling function. However, the precision obtained with such configurations is typically much lower than can be achieved with alternative closed-loop architecture. In design where an MOS transistor is used as sampling switch, input-dependent charge associated with the fast turn-off of the switch is often the principal source of sampling error. This charge injection introduces a pedestal error, in the hold mode that results in both nonlinearity and gain error. Since the resistance of switch is nonlinear as the input voltage varies, a nonlinear voltage appears at the output of the switch. To minimize the magnitude of distortion terms, the resistance is linearized and reduced. By appropriately sizing the device, a compromise can be reached between the size of switch resistance and hold capacitance. This book bringsforth the non-linearities associated with a sampling switch along with different design criteria viz. speed, power, resolution, linearity, noise and harmonic analysis. Seller Inventory # AAV9783659380709

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