micro-nano-MOS device reliability and failure mechanism

 
9787030205865: micro-nano-MOS device reliability and failure mechanism
Buy New View Book

Shipping: FREE
From China to U.S.A.

Destination, Rates & Speeds

Add to Basket

Top Search Results from the AbeBooks Marketplace

1.

HAO YUE LIU HONG XIA
Published by Science Press Pub. Date :2008-03-01 (2008)
ISBN 10: 7030205863 ISBN 13: 9787030205865
New Hardcover Quantity Available: 3
Seller:
liu xing
(JiangSu, JS, China)
Rating
[?]

Book Description Science Press Pub. Date :2008-03-01, 2008. Hardcover. Book Condition: New. Language:Chinese.Author:HAO YUE LIU HONG XIA.Binding:HardCover.Publisher:Science Press Pub. Date :2008-03-01. Bookseller Inventory # 844219

More Information About This Seller | Ask Bookseller a Question

Buy New
US$ 98.08
Convert Currency

Add to Basket

Shipping: FREE
From China to U.S.A.
Destination, Rates & Speeds