Items related to Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Synopsis
The 2 nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.
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Defect Oriented Testing For Nano Metric Cmos Vlsi Circuits
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Soft cover. Condition: New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition. Seller Inventory # 2438289
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
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New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
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International Edition
DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Published by
New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
New
Softcover
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Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide. Seller Inventory # ABNR-9155
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Published by
New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
New
Softcover
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Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability. Seller Inventory # ASNT3-9155
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Published by
New Age International Publisher, 2010
ISBN 10: 8184894295
ISBN 13: 9788184894295
New
Softcover
Seller: ALLBOOKS1, Direk, SA, Australia
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