Items related to CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled...

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies - Softcover

Pavlov, Andrei; Sachdev, Manoj

 
9789048117451: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Softcover
ISBN 10: 9048117453 ISBN 13: 9789048117451
Publisher: Springer, 2008
View all copies of this ISBN edition:
 
 
  • PublisherSpringer
  • Publication date2008
  • ISBN 10 9048117453
  • ISBN 13 9789048117451
  • BindingPaperback
  • Number of pages212

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Other Popular Editions of the Same Title

9781402083624: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Frontiers in Electronic Testing, 40)

Featured Edition

ISBN 10:  1402083629 ISBN 13:  9781402083624
Publisher: Springer, 2008
Hardcover

  • 9789048178551: CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)

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  • 9788132202325: CMOS SRAM: CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES (PROCESS-AWARE SRAM DESIGN AND TEST)

    Spring..., 2011
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