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A Fresh View on Impact Ionization Process: Multistage Scattering Model: Estimation of Ionization Rates of Charge Carriers in Different Semiconductors and in Monolayer Graphene Nanoribbons

Aritra Acharyya

ISBN 10: 3659932590 / ISBN 13: 9783659932595
Published by LAP LAMBERT Academic Publishing, 2017
Condition: Good Soft cover
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Bibliographic Details

Title: A Fresh View on Impact Ionization Process: ...

Publisher: LAP LAMBERT Academic Publishing

Publication Date: 2017

Binding: Paperback

Book Condition:Good

About this title

Synopsis:

This book is presenting a new way of looking into the well-known impact ionization phenomena in reverse biased p-n junctions. It is intended as a text for postgraduate students in applied physics, electrical and electronics engineering and material science. It can exclusively serve as a reference for the scientists who are working in the area of semiconductor device simulation and modeling. The analytical approach of representing impact ionization phenomena based on multistage scattering model will be extremely helpful for the researchers working in the above-mentioned areas of research. The procedure of estimating the ionization rate of charge carriers in different semiconductors and monolayer grapheme nanoribbons via multistage scattering model has been presented in different chapters of this book. The influences of acoustic phonon scattering as well as externally applied steady magnetic field on the ionization rates has also been described in detail in subsequent chapters.

About the Author:

Dr. Aritra Acharyya is currently working as an Assistant Professor of Department of ECE, Cooch Behar Government Engineering College, W.B., India. His research interests are high speed semiconductor devices, transport phenomena, etc. He has authored 5 books and more than 115 research papers in peer reviewed journals and conference proceedings.

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