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IngapGAAS Heterostructure Bipolar Thansistors

Xiu Xing

ISBN 10: 3639100549 / ISBN 13: 9783639100549
Published by VDM Verlag
New Condition: New Soft cover
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108 pages. Dimensions: 8.7in. x 5.9in. x 0.2in.Small-signal modeling and microwave noise characterization of InGaPGaAs HBTs will be explored. Device physics, analytical extraction and numerical optimization are incorporated to extract small-signal equivalent circuit parameters (ECPs), improved by modeling interaction between contact metalizations and hybrid optimization of T and Pi circuit topologies. Excellent agreement between measured and modeled S-parameters, with limited deviation of optimized ECPs from their initial values, is obtained up to 40 GHz for a wide range of bias. Combined with NF50 measurement, frequency- and bias-dependent noise parameters (NPs) up to 20 GHz are extracted using polynomial approximation of noise parameters for intrinsic device. Facilitated by the correction of source mismatch in measurement, great agreement between measured and modeled NF50, as well as acceptably deviated optimized fitting factors, results in a minimum NFmin of 1. 64 dB at 10 GHz for an InGaPGaAs HBT with two 2. 3 by 5. 6 um2 emitters. Study of geometry-dependent performance shows promise of high- speed and low noise InGaPGaAs HBTs using narrow, long, and at least two-sided base contacts. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Bookseller Inventory # 9783639100549

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Bibliographic Details

Title: IngapGAAS Heterostructure Bipolar ...

Publisher: VDM Verlag

Binding: Paperback

Book Condition:New

Book Type: Paperback

About this title

Synopsis:

Small-signal modeling and microwave noise characterization of InGaP/GaAs HBTs will be explored. Device physics, analytical extraction and numerical optimization are incorporated to extract small-signal equivalent circuit parameters (ECPs), improved by modeling interaction between contact metalizations and hybrid optimization of T and Pi circuit topologies. Excellent agreement between measured and modeled S-parameters, with limited deviation of optimized ECPs from their initial values, is obtained up to 40 GHz for a wide range of bias. Combined with NF50 measurement, frequency- and bias-dependent noise parameters (NPs) up to 20 GHz are extracted using polynomial approximation of noise parameters for intrinsic device. Facilitated by the correction of source mismatch in measurement, great agreement between measured and modeled NF50, as well as acceptably deviated optimized fitting factors, results in a minimum NFmin of 1.64 dB at 10 GHz for an InGaP/GaAs HBT with two 2.3 by 5.6 um2 emitters. Study of geometry-dependent performance shows promise of high- speed and low noise InGaP/GaAs HBTs using narrow, long, and at least two-sided base contacts.

About the Author:

Xiu Xing received the Bachelor?s degree in 2005 from Peking University, China. Then she joined University of Notre Dame, focusing on the fabrication, small-signal modeling and microwave noise characterization of HBTs. Now she is working towards her Ph.D. degree, investigating InGaAs-channel MOSFETs with InAlP native oxide gate dielectric.

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