Scanning Electron Microscopy and X-ray Microanalysis: Third Edition

Goldstein, Joseph; Newbury, Dale E.; Joy, David C.; Lyman, Charles E.; Echlin, Patrick; Lifshin, Eric; Sawyer, Linda; Michael, J.R.

Published by Springer, 2013
ISBN 10: 1461349699 / ISBN 13: 9781461349693
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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.

About the Author: This text is written by a team of authors associated with SEM and X-ray Microanalysis Courses presented as part of the Lehigh University Microscopy Summer School. Several of the authors have participated in this activity for more than 30 years.

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Title: Scanning Electron Microscopy and X-ray ...
Publisher: Springer
Publication Date: 2013
Binding: Paperback
Book Condition: Used: Good

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Book Description Springer-Verlag New York Inc., United States, 2013. Paperback. Book Condition: New. Language: English . Brand New Book ***** Print on Demand *****.This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. Softcover reprint of the original 3rd ed. 2003. Bookseller Inventory # AAV9781461349693

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Book Description Springer-Verlag New York Inc., United States, 2013. Paperback. Book Condition: New. Language: English . Brand New Book ***** Print on Demand *****. This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed. 3rd ed. 2003. Softcover reprint of the original 3rd ed. 2003. Bookseller Inventory # AAV9781461349693

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Joseph Goldstein; Dale E. Newbury; David C. Joy; Charles E. Lyman; Patrick Echlin; Eric Lifshin; Linda Sawyer; J.R. Michael
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