FREE TRACKING ON ALL ORDERS! Support Your Planet. Buy CLEAN EARTH BOOKS. Shipping orders swiftly since 2008. A great value for the avid reader! GOOD can range from a well cared for book in great condition to average with signs of slight wear. Overall, All text in great shape! Comes with our 100% Money Back Guarantee. Our customer service cant be beat! Tracking included on all orders. Bookseller Inventory #
Synopsis: Statistical analysis of geographic data has been greatly enhanced in recent years with the advent of Geographical Information Systems (GIS) software. Yet GIS users have struggles to synchronize their applications of spatial information with practical, quantitative statistics. ArcView, one of the most powerful GIS-compatible systems, has become the most popular software among geographers precisely because of its capacity for spatial-quantitative synthesis. Now geographers Jay Lee and David Wong have produced the first handbook for applied ArcView use, bringing the theoretical underpinnings of classical statistics into the earth science environment.
Employing points, lines, and polygons to model real-world geographic forms, this easy-to-use resource provides geographers with a valuable bridge between theory and the software necessary to apply it. It contains sections on point distribution, point pattern analysis, linear features, network analysis, and spatial autocorrelation analysis. Statistical Analysis with ArcView GIS also features:
Examples that show steps of statistical calculations-as well as ways to interpret the results.
More than 100 illustrations, including statistical charts, maps, and ArcView screen captures.
Helpful end-of-chapter references.
Suitable for professionals as well as students of geography, this book is an important tool for anyone involved in the statistical analysis of GIS data.
About the Author: Jay Lee, PhD, is Associate Professor of Geography at Kent State University in Ohio and served as associate editor of the Wiley journal, Applied Geographic Studies.
David W.S. Wong, PhD, is Associate Professor of Earth Sciences at George Mason University in Fairfax, Virginia.
Title: Statistical Analysis with ArcView GIS Reg;
Book Condition: Good
Book Description John Wiley & Sons, 2001. Book Condition: Poor. This book has hardback covers. Ex-library, With usual stamps and markings, In poor condition, suitable as a reading copy. No dust jacket. Bookseller Inventory # 4265526
Book Description Wiley, 2000. Book Condition: Good. 1st. Ships from the UK. Shows some signs of wear, and may have some markings on the inside. Bookseller Inventory # GRP95851818
Book Description Wiley & Sons, Incorporated, John. Hardcover. Book Condition: Good. This book has a light amount of wear to the pages, cover and binding. Bookseller Inventory # G0471348740I3N00
Book Description Wiley, 2000. Book Condition: Very Good. 1st. Former Library book. Great condition for a used book! Minimal wear. Bookseller Inventory # GRP8181207
Book Description Wiley, 2000. Hardcover. Book Condition: Good. Satisfaction 100% guaranteed. Bookseller Inventory # mon0001264143
Book Description Wiley, 2000. Hardcover. Book Condition: Used: Very Good. Bookseller Inventory # SONG0471348740
Book Description Book Condition: Very Good. Book Condition: Very Good. Bookseller Inventory # 97804713487403.0
Book Description Dec 15, 2000. Book Condition: Used: Very Good. VERY CLEAN AND UNMARKED, BINDING VERY GOOD. LIGHT SHELF WEAR TO COVER. Name written in pencil on front end paper. Bookseller Inventory # 49-39191
Book Description John Wiley & Sons Inc, 2001. Hardcover. Book Condition: Fine. Dust Jacket Condition: n/a. New. Fine in publisher's decorated laminated boards. Available in our UK premises for prompt dispatch worldwide. Bookseller Inventory # PBFH035370
Book Description John Wiley & Sons Australia, Limited, Milton, QLD, Australia, 2001. HARDBACK. Book Condition: Fine ( AS NEW). No Jacket. Illustrated Throughout (illustrator). This book is part of a large purchase from a Public Sector Library and except where mentioned are for the most part LIKE NEW! MOSTLY the ONLY flaws are the blacked out (they insisted) Library stamps which show many of them to be UNUSED! FEEL FREE TO E-MAIL FOR PHOTOGRAPHS AND FURTHER DETAILS. FROM A DEALER WHO TELLS YOU WHO THEY ARE AND WHAT THEIR TELEPHONE AND ADDRESS CONTACT DETAILS ARE! Size: 8vo - over 7¾" - 9¾". EX PUBLIC SECTOR LIBRARY BLACKED OUT STAMPS. HARDBACK. Bookseller Inventory # 33333334711