Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August . (Lecture Notes in Computer Science)

Yeung, Dit-Yan [Editor]; Kwok, James T. [Editor]; Fred, Ana [Editor]; Roli, Fabio [Editor]; de Ridder, Dick [Editor];

ISBN 10: 3540372369 / ISBN 13: 9783540372363

Published by Springer, 2006

About this Item

Ex-library paperback in very nice condition with the usual markings and attachments. Text block clean and unmarked. Tight binding.

Seller Inventory # UTD1420099

Bibliographic Details

• Title: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August . (Lecture Notes in Computer Science)
• Publisher: Springer
• Publication Date: 2006
• Language: English
• ISBN 10: 3540372369
• ISBN 13: 9783540372363
• Binding: Paperback
• Condition: Very Good

About this title

Synopsis

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.