VLSI Test Principles and Architectures

Wang, Laung-Terng/ Wu, Cheng-Wen/ Wen, Xiaoqing

ISBN 10: 1493300865 / ISBN 13: 9781493300860

Published by Morgan Kaufmann, 2006

About this Item

1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.

Seller Inventory # zk1493300865

Bibliographic Details

• Title: VLSI Test Principles and Architectures
• Publisher: Morgan Kaufmann
• Publication Date: 2006
• Language: English
• ISBN 10: 1493300865
• ISBN 13: 9781493300860
• Binding: Paperback
• Condition: Brand New

About this title

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

About the Author

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).