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hardcover. Condition: As New. Ships Out Tomorrow!
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Condition: New.
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Condition: New.
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US$ 188.47
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 185.41
Convert currencyUS$ 16.08 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 201.53
Convert currencyUS$ 20.13 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 211.31
Convert currencyUS$ 20.13 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Condition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-scaled Technologies
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
US$ 246.14
Convert currencyUS$ 12.24 shipping from Ireland to U.S.A.Quantity: 15 available
Add to basketCondition: New. This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2010. 1st ed. Softcover of orig. ed. 2008. Paperback. . . . .
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
US$ 252.69
Convert currencyUS$ 12.24 shipping from Ireland to U.S.A.Quantity: 15 available
Add to basketCondition: New. This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 166 x 19. Weight in Grams: 468. . 2008. 2008th Edition. hardcover. . . . .
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US$ 143.05
Convert currencyUS$ 122.36 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
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US$ 143.05
Convert currencyUS$ 122.36 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: New. This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 234 x 156 x 11. Weight in Grams: 305. . 2010. 1st ed. Softcover of orig. ed. 2008. Paperback. . . . . Books ship from the US and Ireland.
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Condition: New. This book covers a broad range of topics related to SRAM design and testing. It includes everything from SRAM operation basics through cell electrical and physical design to process-aware and economical approach to SRAM testing. Series: Frontiers in Electronic Testing. Num Pages: 210 pages, biography. BIC Classification: TJFC. Category: (P) Professional & Vocational. Dimension: 239 x 166 x 19. Weight in Grams: 468. . 2008. 2008th Edition. hardcover. . . . . Books ship from the US and Ireland.
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US$ 287.53
Convert currencyUS$ 33.55 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. Like New. book.
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US$ 319.32
Convert currencyUS$ 33.55 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. Like New. book.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by Springer Netherlands, 2010
ISBN 10: 904817855X ISBN 13: 9789048178551
Language: English
US$ 175.39
Convert currencyUS$ 57.09 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by Springer Netherlands, 2008
ISBN 10: 1402083629 ISBN 13: 9781402083624
Language: English
US$ 175.39
Convert currencyUS$ 57.09 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
