Published by Martin Kelter Verlag, Hamburg
Seller: Deichkieker Bücherkiste, Lemwerder, NS, Germany
Softcover. Condition: SEHR GUT. 120 g. deutsch 130 pages.
Condition: New. pp. 235.
Condition: New. pp. 248.
Seller: Roland Antiquariat UG haftungsbeschränkt, Weinheim, Germany
Softcover/Paperback. 7., überarb. und erw. Aufl. XVIII, 604 S.; Ill. Sehr guter Zustand. Leseseiten sind sauber und ohne Markierungen. Buch weist leichte Lagerspuren auf. Sonst sehr gutes Exemplar. 9783835100459 Sprache: Deutsch Gewicht in Gramm: 1100.
Language: English
Published by Springer-Verlag New York Inc, 2016
ISBN 10: 3662525291 ISBN 13: 9783662525296
Seller: Revaluation Books, Exeter, United Kingdom
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Add to basketPaperback. Condition: Brand New. rep rev edition. 248 pages. 9.25x6.10x0.59 inches. In Stock.
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
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Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: New.
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Condition: New.
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Condition: New.
Language: English
Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Nov 2013, 2013
ISBN 10: 3642450725 ISBN 13: 9783642450723
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Buch. Condition: Neu. Neuware -This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 248 pp. Englisch.
Language: English
Published by Springer Berlin Heidelberg, 2016
ISBN 10: 3662525291 ISBN 13: 9783662525296
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
Language: English
Published by Springer Berlin Heidelberg, 2013
ISBN 10: 3642450725 ISBN 13: 9783642450723
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains extended and revised versions of the best papers presented at the 20th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2012, held in Santa Cruz, CA, USA, in October 2012. The 12 papers included in the book were carefully reviewed and selected from the 33 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about stimulating new challenges both at the physical and system-design levels, as well as in the test of these systems.
Seller: California Books, Miami, FL, U.S.A.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Seller: Mispah books, Redhill, SURRE, United Kingdom
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Seller: Mispah books, Redhill, SURRE, United Kingdom
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Language: German
Published by Springer Vieweg 2012-10-30, 2012
ISBN 10: 3834819522 ISBN 13: 9783834819529
Seller: Chiron Media, Wallingford, United Kingdom
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Add to basketCondition: New. In German.
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Seller: Ria Christie Collections, Uxbridge, United Kingdom
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Language: English
Published by Springer International Publishing AG, CH, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
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Add to basketHardback. Condition: New. 1st ed. 2018.
Seller: Revaluation Books, Exeter, United Kingdom
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Add to basketHardcover. Condition: Brand New. 146 pages. 9.25x6.25x0.50 inches. In Stock.
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Condition: New. pp. 146.
Seller: Revaluation Books, Exeter, United Kingdom
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Add to basketPaperback. Condition: Brand New. 176 pages. German language. 11.77x7.83x0.59 inches. In Stock.
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Add to basketPaperback. Condition: Brand New. reprint edition. 146 pages. 9.25x6.10x0.36 inches. In Stock.
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Condition: As New. Unread book in perfect condition.
Language: English
Published by Springer International Publishing AG, CH, 2017
ISBN 10: 3319604015 ISBN 13: 9783319604015
Seller: Rarewaves.com UK, London, United Kingdom
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Add to basketHardback. Condition: New. 1st ed. 2018. This book pioneers the field of gain-cell embedded DRAM (GC-eDRAM) design for low-power VLSI systems-on-chip (SoCs). Novel GC-eDRAMs are specifically designed and optimized for a range of low-power VLSI SoCs, ranging from ultra-low power to power-aware high-performance applications. After a detailed review of prior-art GC-eDRAMs, an analytical retention time distribution model is introduced and validated by silicon measurements, which is key for low-power GC-eDRAM design. The book then investigates supply voltage scaling and near-threshold voltage (NTV) operation of a conventional gain cell (GC), before presenting novel GC circuit and assist techniques for NTV operation, including a 3-transistor full transmission-gate write port, reverse body biasing (RBB), and a replica technique for optimum refresh timing. Next, conventional GC bitcells are evaluated under aggressive technology and voltage scaling (down to the subthreshold domain), before novel bitcells for aggressively scaled CMOS nodes and soft-error tolerance as presented, including a 4-transistor GC with partial internal feedback and a 4-transistor GC with built-in redundancy.
Published by Vieweg Teubner, 2009
Seller: biblion2, Obersulm, Germany
Condition: very good. Broschiert. Sofortversand aus Deutschland. Artikel wiegt maximal 1000g. Bibliotheksexemplar mit Stempel und Kleber. 439 Seiten.