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US$ 107.07
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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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US$ 54.39
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Add to baskethardcover. Condition: Befriedigend. 778 Seiten; 9783540738855.4 Gewicht in Gramm: 2.
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Add to baskethardcover. Condition: Befriedigend. 767 Seiten; 9783540678410.4 Gewicht in Gramm: 2.
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Transmission Electron Microscopy and Diffractometry of Materials.
Published by Springer, 2007
Language: English
Seller: Antiquariat Thomas Haker GmbH & Co. KG, Berlin, Germany
Association Member: GIAQ
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Add to basketHardcover. Condition: Wie neu. 778 S., Like new. Shrink wrapped. / Wie neu. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 1355 3rd corrected Ed. 2008, corr. 2nd printing 2009.
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Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 142.87
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Hardcover. Condition: New. 3rd Edition. 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day with free tracking.
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![Stock image for Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. for sale by BUCHSERVICE / ANTIQUARIAT Lars Lutzer](https://pictures.abebooks.com/isbn/9783540738855-us-300.jpg)
Transmission Electron Microscopy and Diffractometry of Materials [Englisch] [Gebundene Ausgabe] Brent Fultz (Autor), James Howe (Autor) This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
Published by Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
ISBN 10: 3540738851 ISBN 13: 9783540738855
Language: English
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Seller rating 5 out of 5 stars
US$ 130.59
Convert currencyUS$ 34.84 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.
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US$ 138.58
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US$ 142.70
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US$ 149.56
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US$ 225.02
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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Transmission Electron Microscopy and Diffractometry of Materials
Published by Springer Berlin Heidelberg, 2014
ISBN 10: 3642433154 ISBN 13: 9783642433153
Language: English
US$ 92.46
Convert currencyUS$ 56.98 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .
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Transmission Electron Microscopy and Diffractometry of Materials
Published by Springer Berlin Heidelberg, 2012
ISBN 10: 3642297609 ISBN 13: 9783642297601
Language: English
US$ 128.29
Convert currencyUS$ 56.98 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching .
