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Hakim Edward (44 results)
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Hardcover. Condition: Fair. No Jacket. 1st Edition. This book is seriously flawed by the fact that pages 289 to 307 function as an insert. They are completely separated from the binding. But the book is all there and is otherwise in new condition. There are no tears or signs of wear to the clean pages or the cover.
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Plastic-Encapsulated Microelectronics: Materials, Processes, Quality, Reliability, and Applications
Language: English
Published by John Wiley & Sons, NY, 1995
ISBN 10: 0471306258 ISBN 13: 9780471306252
Condition: Very Good. Hardcover, [xxxiv], 474 pages. Very Good condition/no dust jacket. Ex-library. Size 9.5"x6.5". "For the first time between two covers, here is a comprehensive, critical review of the state of the art in PEMs and assemblies that incorporate them. The most timely book on the subject, it provides professionals with a systematic, scientific exploration of crucial technical and reliability issues concerning the manufacture and use of PEMs - with special attention focusing on environment-specific applications." Library stamp on front pastedown & title page, previous owner's name on front & rear pastedowns, else Near Fine condition, clean and unmarked.
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Plasticâ"Encapsulated Microelectronics: Materials, Processes, Quality, Reliability, and Applications
US$ 23.70
US$ 11.87 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. Most items will be dispatched the same or the next working day. A copy that has been read but remains in clean condition. All of the pages are intact and the cover is intact and the spine may show signs of wear. The book may have minor markings which are not specifically mentioned. Ex library copy with usual stamps & stickers.
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Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Condition: As New. Unread book in perfect condition.
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 62.25
US$ 20.47 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Influence of Temperature on Microelectronics and System Reliability
Book 4 of 4: Electronic PackagingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 69.29
US$ 16.35 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Influence of Temperature on Microelectronics and System Reliability : A Physics of Failure Approach
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 68.24
US$ 20.47 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach
Book 4 of 4: Electronic PackagingLanguage: English
Published by Taylor & Francis Ltd, 2019
ISBN 10: 0367400979 ISBN 13: 9780367400972
US$ 97.15
US$ 17.06 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 336 pages. 10.00x7.01x0.67 inches. In Stock.
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Condition: New.
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Safeguarding Homeland Security : Governors and Mayors Speak Out
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.91
US$ 20.47 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Influence of Temperature on Microelectronics and System Reliability
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 146.15
US$ 20.47 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketCondition: As New. Unread book in perfect condition.
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Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)
Language: English
Published by Artech House Publishers, 1989
ISBN 10: 0890062846 ISBN 13: 9780890062845
Condition: New.
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)
Book 4 of 4: Electronic PackagingUS$ 134.92
US$ 34.11 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. Like NewLIKE NEW. book.
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Condition: As New. Unread book in perfect condition.
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Influence of Temperature on Microelectronics and System Reliability
Book 4 of 4: Electronic PackagingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 170.14
US$ 20.47 shipping
Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketCondition: New.
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)
Book 4 of 4: Electronic PackagingLanguage: English
Published by Taylor & Francis Group, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
Condition: New. pp. 336 1st Edition.
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Microelectronic Reliability, Vol. 1: Reliability, Test and Diagnostics (Artech House Materials Science Library) (English and Italian Edition)
Language: English
Published by Artech House Publishers, 1989
ISBN 10: 0890062846 ISBN 13: 9780890062845
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 180.33
US$ 16.35 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Influence of Temperature on Microelectronics and System Reliability: A Physics of Failure Approach (Electronic Packaging)
Book 4 of 4: Electronic PackagingLanguage: English
Published by CRC Press 1997-04-24, 1997
ISBN 10: 0849394503 ISBN 13: 9780849394508
US$ 199.38
US$ 21.14 shipping
Ships from United Kingdom to U.S.A.Quantity: 5 available
Add to basketHardcover. Condition: New.
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US$ 172.93
US$ 57.95 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Lall, Pradeep Pecht, Michael Hakim, Edward B.This book raises the level of understanding of thermal design criteria. It provides the design team with sufficient knowledge to help them evaluate device architecture trade-offs and the effects of o.
