Ter Maten Jan (117 results)

Hardcover/Pappeinband. Condition: Sehr gut. 432 p. Very good. Shrink wrapped. / Sehr guter Zustand. In Folie verschweißt. Sprache: Englisch Gewicht in Gramm: 866.

xi, 256 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.

Condition: New. pp. 436.

Condition: New. pp. 436 Illus.

Hardcover. Condition: As New. 1. Auflage. Unread, like new. Immediately dispatched from Germany.

Condition: New. pp. 436.

Condition: New. 1st ed. 2019 edition NO-PA16APR2015-KAP.

Condition: New.

24 cm. original hardcover. 418 pp. many ills, diagrams. references. index. "Mathematics in Industry". -(foot spine bumped, otherwise (very) good). 770g.

Condition: New. pp. XXX, 587 300 illus., 200 illus. in color. 1st ed. 2019 edition NO-PA16APR2015-KAP.

Condition: As New. Unread book in perfect condition.

Condition: New. In.

Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Condition: New.

Condition: As New. Unread book in perfect condition.

Taschenbuch. Condition: Neu. Neuware -Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing;(2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma);(3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated.All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms¿ industrial applicability.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 620 pp. Englisch.

Taschenbuch. Condition: Neu. Nanoelectronic Coupled Problems Solutions | E. Jan W. Ter Maten (u. a.) | Taschenbuch | Mathematics in Industry | xxx | Englisch | 2020 | Springer | EAN 9783030307288 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Condition: Very Good.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.

Condition: New.

Paperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.

Buch. Condition: Neu. Neuware -Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers:(1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing;(2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma);(3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated.All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms¿ industrial applicability.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 620 pp. Englisch.

Hardcover. Condition: Brand New. 620 pages. 9.25x6.10x1.54 inches. In Stock.

Hardcover. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.

Taschenbuch. Condition: Neu. Progress in Differential-Algebraic Equations | Deskriptor 2013 | Sebastian Schöps (u. a.) | Taschenbuch | x | Englisch | 2014 | Springer | EAN 9783662449257 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Taschenbuch. Condition: Neu. Neuware -This book contains the proceedings of the 8th Workshop on Coupled Descriptor Systems held March 2013 in the Castle of Eringerfeld, Geseke in the neighborhood of Paderborn, Germany. It examines the wide range of current research topics in descriptor systems, including mathematical modeling, index analysis, wellposedness of problems, stiffness and different time-scales, cosimulation and splitting methods and convergence analysis. In addition, the book also presents applications from the automotive and circuit industries that show that descriptor systems provide challenging problems from the point of view of both theory and practice.The book contains nine papers and is organized into three parts: control, simulation, and model order reduction. It will serve as an ideal resource for applied mathematicians and engineers, in particular those from mechanics and electromagnetics, who work with coupled differential equations.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 220 pp. Englisch.

Paperback. Condition: Brand New. 2014 edition. 208 pages. 8.75x6.00x0.50 inches. In Stock.

Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains the proceedings of the 8th Workshop on Coupled Descriptor Systems held March 2013 in the Castle of Eringerfeld, Geseke in the neighborhood of Paderborn, Germany. It examines the wide range of current research topics in descriptor systems, including mathematical modeling, index analysis, wellposedness of problems, stiffness and different time-scales, cosimulation and splitting methods and convergence analysis. In addition, the book also presents applications from the automotive and circuit industries that show that descriptor systems provide challenging problems from the point of view of both theory and practice. The book contains nine papers and is organized into three parts: control, simulation, and model order reduction. It will serve as an ideal resource for applied mathematicians and engineers, in particular those from mechanics and electromagnetics, who work with coupled differential equations.

Condition: New. In.