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Wang Laung Terng (26 results)
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Condition: acceptable. Fairly worn, but readable and intact. If applicable: Dust jacket, disc or access code may not be included.
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Condition: Like New. hardcover. Page block firm and clean, binding unblemished, boards straight, without markings of any kind. Supporting Bay Area Friends of the Library since 2010. Well packaged and promptly shipped.
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Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
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Condition: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.
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System-on-Chip Test Architectures: Nanometer Design for Testability: Volume . (Systems on Silicon)
Language: English
Published by Morgan Kaufmann 2007-12-28, 2007
ISBN 10: 012373973X ISBN 13: 9780123739735
US$ 73.52
US$ 20.55 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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Condition: New. pp. xxxvi + 856 Illus.
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VLSI Test Principles and Architectures,: Design for Testability (Systems on Silicon)
Language: English
Published by Morgan Kaufmann 2006-08-14, 2006
ISBN 10: 0123705975 ISBN 13: 9780123705976
US$ 78.18
US$ 20.55 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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Condition: New. pp. xxx + 777 Illus.
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US$ 85.97
US$ 26.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. illustrated edition. 896 pages. 9.50x7.50x1.50 inches. In Stock.
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Electronic Design Automation: Synthesis, Verification, and Test (Systems on Silicon)
Language: English
Published by Morgan Kaufmann Publishers In 2008-12-05, 2008
ISBN 10: 0123743648 ISBN 13: 9780123743640
US$ 94.42
US$ 20.55 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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US$ 108.18
US$ 8.62 shipping
Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. xxxv + 934 Illus.
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US$ 92.27
US$ 26.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 1st edition. 777 pages. 9.25x7.50x2.00 inches. In Stock.
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Condition: New. pp. xxxvi + 856.
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Condition: New. pp. xxxvi + 856.
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Condition: New. pp. xxx + 777.
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Condition: New. pp. xxx + 777.
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US$ 110.70
US$ 26.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 1st edition. 972 pages. 9.40x7.40x1.80 inches. In Stock.
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Condition: New. pp. xxxv + 934.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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Condition: New. pp. xxxv + 934.
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US$ 132.88
US$ 26.54 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Brand New. 1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.
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VLSI Test Principles and Architectures: Design for Testability
Language: English
Published by Morgan Kaufmann Publishers, 2006
ISBN 10: 1493300865 ISBN 13: 9781493300860
US$ 269.24
US$ 33.17 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
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Condition: new. Questo è un articolo print on demand.
