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Published by Wiley-Interscience, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: HPB-Red, Dallas, TX, U.S.A.
Book
Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!.
Published by Wiley & Sons, Incorporated, John, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: Better World Books: West, Reno, NV, U.S.A.
Book First Edition
Condition: Good. 1st Edition. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
Published by Wiley & Sons, Incorporated, John, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: Better World Books, Mishawaka, IN, U.S.A.
Book First Edition
Condition: Good. 1st Edition. Used book that is in clean, average condition without any missing pages.
Published by Wiley-Interscience 15 A, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: AwesomeBooks, Wallingford, United Kingdom
Book
Hardcover. Condition: Very Good. Principles of Testing Electronic Systems (Wiley-Interscience) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
Published by Wiley-Interscience 00/g /15 A, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: Bahamut Media, Reading, United Kingdom
Book
Hardcover. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
Published by Hoboken, New Jersey, U.S.A.: Wiley-Interscience, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: Bingo Books 2, Vancouver, WA, U.S.A.
Book
Hardcover. Condition: Near Fine. hardback book in near fine condition.
Published by Kluwer Academic Publishers, Norwell, Massachusetts, U.S.A., 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Seller: PsychoBabel & Skoob Books, Didcot, Oxfordshire, OXON, United Kingdom
Book First Edition
hardcover. Condition: Very Good. Dust Jacket Condition: No Dust Jacket. Reprint. Reprinted from a Special Issue of Journal of Electronic Testing Theory and Applications, Vol. 10, Nos. 1 & 2, April 1997. Hardcover with slightly softened tail of spine and slightly bumped top corners and contents in very good clean condition. Previous owner's name on FEP. Profusely illustrated by diagrams and tables. No dust jacket. T. Used.
Published by Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Book
Condition: New.
Published by Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: booksXpress, Bayonne, NJ, U.S.A.
Book Print on Demand
Soft Cover. Condition: new. This item is printed on demand.
Published by Springer, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Book Print on Demand
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Springer 2015-08, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: Chiron Media, Wallingford, United Kingdom
Book
PF. Condition: New.
Published by Springer International Publishing Aug 2015, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Book Print on Demand
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefully reviewed and selected from 28 submissions. CRIWG has been focused on collaboration technology design, development, and evaluation. The background research is influenced by a number of disciplines, such as computer science, management science, informationsystems, engineering, psychology, cognitive sciences, and social sciences. 264 pp. Englisch.
Published by John Wiley & Sons, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: Buchpark, Trebbin, Germany
Book First Edition
Condition: Sehr gut. 1., Auflage. Gepflegter, sauberer Zustand. 610625/2.
Published by John Wiley & Sons, 2000
ISBN 10: 0471319317ISBN 13: 9780471319313
Seller: Buchpark, Trebbin, Germany
Book First Edition
Condition: Gut. 1., Auflage. Gebrauchs- und Lagerspuren. AuÃ?en: verschmutzt, angestoÃ?en. Innen: Seiten eingerissen. 610625/3.
Published by Springer-Verlag New York Inc, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: Revaluation Books, Exeter, United Kingdom
Book
Paperback. Condition: Brand New. 264 pages. 9.25x6.10x0.60 inches. In Stock.
Published by Springer International Publishing, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: AHA-BUCH GmbH, Einbeck, Germany
Book
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefully reviewed and selected from 28 submissions. CRIWG has been focused on collaboration technology design, development, and evaluation. The background research is influenced by a number of disciplines, such as computer science, management science, informationsystems, engineering, psychology, cognitive sciences, and social sciences.
Published by Springer US, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Seller: Buchpark, Trebbin, Germany
Book
Condition: Gut. Gebrauchs- und Lagerspuren. AuÃ?en: verschmutzt, angestoÃ?en. Innen: Seiten eingerissen, Seiten verschmutzt. 3027772/3 Reprinted from JOURNAL OF ELECTRONIC TESTING, 10:1-2, 1997.
Published by Springer International Publishing, 2015
ISBN 10: 3319227467ISBN 13: 9783319227467
Seller: moluna, Greven, Germany
Book Print on Demand
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book constitutes the refereed proceedings of the 21st International Conference on Collaboration and Technology, CRIWG 2015, held in Yerevan, Armenia, in September 2015.The 19 revised papers presented together with 1 invited talk were carefull.
Published by Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Seller: booksXpress, Bayonne, NJ, U.S.A.
Book Print on Demand
Soft Cover. Condition: new. This item is printed on demand.
Published by Springer, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Seller: booksXpress, Bayonne, NJ, U.S.A.
Book Print on Demand
Hardcover. Condition: new. This item is printed on demand.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: booksXpress, Bayonne, NJ, U.S.A.
Book
Hardcover. Condition: new.
Published by Springer, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Book
Condition: New.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Book
Condition: New.
Published by Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Book
Condition: New.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Book Print on Demand
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Springer, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Book Print on Demand
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Springer, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Book Print on Demand
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Springer US Dez 2010, 2010
ISBN 10: 1441950338ISBN 13: 9781441950338
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Book Print on Demand
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 164 pp. Englisch.
Published by Springer US Okt 2012, 2012
ISBN 10: 1461377986ISBN 13: 9781461377986
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Book Print on Demand
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch.
Published by Springer US Mai 1997, 1997
ISBN 10: 079239920XISBN 13: 9780792399209
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Book Print on Demand
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2). 168 pp. Englisch.