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Pietsch, Ullrich, Vaclav Holy, Tilo Baumbach

Published by Springer, New York (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, New York, 2004. Hardcover. Book Condition: Near Fine. Dust Jacket Condition: No Dust Jacket. Second Edition. Slight wear. Crisp hardcover.; "The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists." Contents: 1. Elements for designing an X-ray diffraction experiment --2. Diffractometers and reflectometers --3. Scans and resolution in angular and reciprocal space --4. Basic principles --5. Kinematical theory --6. Dynamical theory --7. Semikinematical theory --8. Determination of layer thicknesses of single layers and multilayers --9. Lattice parameters and strains in epitaxial layers and multilayers --10. Diffuse scattering from volume defects in thin layers --11. X-ray scattering by rough multilayers --12. X-ray scattering by artificially lateral semiconductor nanostructures --13. Strain analysis in periodic nanostructures --14. X-ray scattering from self-organized structures.; Advanced Texts in Physics; xvi, 408 pages. Bookseller Inventory # 9614

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Ullrich Pietsch

Published by Springer 2004-08-27 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer 2004-08-27, 2004. Hardcover. Book Condition: good. 2nd. 0387400923. Bookseller Inventory # 509186

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Ulrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer-Verlag New York Inc., United States (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag New York Inc., United States, 2004. Hardback. Book Condition: New. 2nd ed. 2004. Language: English . Brand New Book. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap- pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. Bookseller Inventory # LIB9780387400921

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Ullrich Pietsch; Vaclav Holy; Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2004. Book Condition: Good. A+ Customer service! Satisfaction Guaranteed! Book is in Used-Good condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain limited notes and highlighting. Bookseller Inventory # 0387400923-2-4

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Ullrich Pietsch; Vaclav Holy; Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2004. Hardcover. Book Condition: Used: Good. This item is printed on demand. Bookseller Inventory # SONG0387400923

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Ullrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer New York 2004-08-27, New York |London (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer New York 2004-08-27, New York |London, 2004. hardback. Book Condition: New. Bookseller Inventory # 9780387400921

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Ulrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer-Verlag New York Inc., United States (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag New York Inc., United States, 2004. Hardback. Book Condition: New. 2nd ed. 2004. Language: English . Brand New Book. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap- pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. Bookseller Inventory # LIB9780387400921

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Pietsch, Ulrich

Published by Springer-Verlag New York Inc. (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag New York Inc., 2004. HRD. Book Condition: New. New Book.Shipped from US within 10 to 14 business days.THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bookseller Inventory # IP-9780387400921

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Pietsch, Ullrich, Holy, Vaclav, Baumbach

Published by Springer (2017)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2017. Hardcover. Book Condition: Very Good. Great condition with minimal wear, aging, or shelf wear. This item is printed on demand. Bookseller Inventory # P020387400923

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Pietsch, Ulrich/Holy, Vaclav/Baumbach, Tilo

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: 2004. Book Condition: New. Bookseller Inventory # L9780387400921

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Book Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Bookseller Inventory # 9780387400921

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Pietsch, Ullrich

Published by Springer (2016)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2016. Paperback. Book Condition: New. PRINT ON DEMAND Book; New; Publication Year 2016; Not Signed; Fast Shipping from the UK. No. book. Bookseller Inventory # ria9780387400921_lsuk

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Ullrich Pietsch

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2004. Hardcover. Book Condition: Brand New. 2nd edition. 408 pages. 9.25x6.25x1.00 inches. In Stock. Bookseller Inventory # __0387400923

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Book Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Bookseller Inventory # 9780387400921

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Book Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Bookseller Inventory # 9780387400921

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Ulrich Pietsch

Published by Springer-Verlag New York Inc. (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag New York Inc., 2004. HRD. Book Condition: New. New Book. Delivered from our US warehouse in 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND.Established seller since 2000. Bookseller Inventory # IP-9780387400921

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Ullrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2004. Hardcover. Book Condition: New. 2nd. This item is printed on demand. Bookseller Inventory # DADAX0387400923

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ULLRICH PIETSCH

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2004. Hardback. Book Condition: NEW. 9780387400921 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Bookseller Inventory # HTANDREE0273515

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Ullrich Pietsch

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2004. Hardcover. Book Condition: Good. 2nd. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. Buy with confidence, excellent customer service!. Bookseller Inventory # 0387400923

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Book Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Bookseller Inventory # 9780387400921

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Pietsch, Ullrich

Published by Springer (2017)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2017. Hardcover. Book Condition: New. Never used! This item is printed on demand. Bookseller Inventory # 0387400923

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Pietsch, Ullrich, Holy, Vaclav, Baumbach

Published by Springer (2017)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2017. Hardcover. Book Condition: New. Never used! This item is printed on demand. Bookseller Inventory # P110387400923

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Pietsch, Ullrich, Holy, Vaclav, Baumbach

Published by Springer (2017)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Springer, 2017. Hardcover. Book Condition: Like New. Almost new condition. This item is printed on demand. Bookseller Inventory # P010387400923

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Ullrich Pietsch; Vaclav Holy; Tilo Baumbach

Published by Springer (2004)

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Item Description: Springer, 2004. Hardcover. Book Condition: New. book. Bookseller Inventory # M0387400923

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Ullrich Pietsch,Vaclav Holy,Tilo Baumbach

ISBN 10: 0387400923 ISBN 13: 9780387400921

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Item Description: Book Condition: New. Brand new book, sourced directly from publisher. Dispatched within 2 working days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Bookseller Inventory # NU-ING-00727148

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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo

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Item Description: Springer. Hardcover. Book Condition: New. 0387400923 Special order direct from the distributor. Bookseller Inventory # ING9780387400921

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Ullrich Pietsch

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Item Description: Springer. Hardcover. Book Condition: New. Hardcover. 408 pages. Dimensions: 9.2in. x 5.8in. x 0.8in.During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Hardcover. Bookseller Inventory # 9780387400921

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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo

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Item Description: Springer. Hardcover. Book Condition: Fine. 0387400923 Like New Condition. Bookseller Inventory # LN7.1061756

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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo

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Item Description: Springer. Hardcover. Book Condition: New. 0387400923 New Condition. Bookseller Inventory # NEW7.1061756

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