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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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From: Alplaus Books (Alplaus, NY, U.S.A.)

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About this Item: Springer, 2004. Hardcover. Condition: Used: Good. 2nd. Hardbound without dust jacket. Name blacked out on title page and front free endpapers, else unmarked with modest wear. Corner slightly bumped. Seller Inventory # 49992a

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Pietsch, Ullrich

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. Hardcover. Condition: VERY GOOD. Pages are intact and are not marred by notes or highlighting, but may contain a neat previous owner name. The spine remains undamaged. Seller Inventory # 0387400923_abe_vg

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Ullrich Pietsch; Vaclav Holy; Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. Hardcover. Condition: Used: Good. Seller Inventory # SONG0387400923

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Ullrich Pietsch; Vaclav Holy; Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. Condition: Good. A+ Customer service! Satisfaction Guaranteed! Book is in Used-Good condition. Pages and cover are clean and intact. Used items may not include supplementary materials such as CDs or access codes. May show signs of minor shelf wear and contain limited notes and highlighting. Seller Inventory # 0387400923-2-4

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Pietsch, Ullrich, Vaclav Holy, Tilo Baumbach

Published by Springer, New York (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, New York, 2004. Hardcover. Condition: Near Fine. Dust Jacket Condition: No Dust Jacket. Second Edition. Slight wear. Crisp hardcover.; "The book presents a detailed description of high-resolution x-ray scattering methods suitable for the investigation of the real structure of single-crystalline layers and multilayers, including structure defects in the layers and at the interfaces. Particular attention is devoted to lateral structures in semiconductors and semiconductor multilayers such as quantum wires and quantum dots. Both the theoretical background and the application of the methods are discussed. The second edition is extended to deal with lateral surface nanostructures such as gratings and dots, new examples for measuring layer thickness, lattice mismatch, and surface/interface roughness. The book will be an invaluable source for graduates and scientists." Contents: 1. Elements for designing an X-ray diffraction experiment --2. Diffractometers and reflectometers --3. Scans and resolution in angular and reciprocal space --4. Basic principles --5. Kinematical theory --6. Dynamical theory --7. Semikinematical theory --8. Determination of layer thicknesses of single layers and multilayers --9. Lattice parameters and strains in epitaxial layers and multilayers --10. Diffuse scattering from volume defects in thin layers --11. X-ray scattering by rough multilayers --12. X-ray scattering by artificially lateral semiconductor nanostructures --13. Strain analysis in periodic nanostructures --14. X-ray scattering from self-organized structures.; Advanced Texts in Physics; xvi, 408 pages. Seller Inventory # 9614

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Ullrich Pietsch

Published by Springer 2004-08-27 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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From: Lost Books (AUSTIN, TX, U.S.A.)

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About this Item: Springer 2004-08-27, 2004. Hardcover. Condition: Good. 2nd. 0387400923. Seller Inventory # 509186

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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo; Pietsch, Ulrich

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Condition: As New. Unread copy in perfect condition. Seller Inventory # 2479490

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Ulrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer-Verlag New York Inc., United States (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer-Verlag New York Inc., United States, 2004. Hardback. Condition: New. 2nd ed. 2004. Language: English. Brand new Book. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap- pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. Seller Inventory # LIB9780387400921

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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo; Pietsch, Ulrich

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Condition: New. Seller Inventory # 2479490-n

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Ulrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer-Verlag New York Inc., United States (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer-Verlag New York Inc., United States, 2004. Hardback. Condition: New. 2nd ed. 2004. Language: English. Brand new Book. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap- pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. Seller Inventory # LHB9780387400921

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Ulrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer-Verlag New York Inc., United States (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer-Verlag New York Inc., United States, 2004. Hardback. Condition: New. 2nd ed. 2004. Language: English. Brand new Book. During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap- pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. Seller Inventory # LIB9780387400921

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Ullrich Pietsch, Václav HolÔy, Tilo Baumbach

Published by Springer New York 2004-08-27, New York |London (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer New York 2004-08-27, New York |London, 2004. hardback. Condition: New. Seller Inventory # 9780387400921

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Ullrich Pietsch,Vaclav Holy,Tilo Baumbach

Published by Springer 2004-09-29 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer 2004-09-29, 2004. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 4-5 working days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Seller Inventory # NU-LBR-00645355

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Ullrich Pietsch, Vaclav Holy, Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. Hardcover. Condition: New. 2nd. Seller Inventory # DADAX0387400923

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Pietsch, Ullrich

Published by Springer (2017)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2017. Paperback. Condition: New. PRINT ON DEMAND Book; New; Publication Year 2017; Not Signed; Fast Shipping from the UK. No. book. Seller Inventory # ria9780387400921_lsuk

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Seller Inventory # 9780387400921

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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From: BuchWeltWeit Inh. Ludwig Meier e.K. (Bergisch Gladbach, Germany)

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About this Item: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Seller Inventory # 9780387400921

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Ullrich Pietsch; Vaclav Holy; Tilo Baumbach

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. New. Seller Inventory # S-0387400923

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Ullrich Pietsch,Vaclav Holy,Tilo Baumbach

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 4-5 working days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Seller Inventory # NU-ING-00727148

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Pietsch, Ullrich

Published by Springer (2019)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2019. Hardcover. Condition: New. Never used! This item is printed on demand. Seller Inventory # 0387400923

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Ulrich Pietsch

Published by Springer-Verlag Gmbh Aug 2004 (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer-Verlag Gmbh Aug 2004, 2004. Buch. Condition: Neu. Neuware - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers. 408 pp. Englisch. Seller Inventory # 9780387400921

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Ullrich Pietsch

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. Hardcover. Condition: Good. 2nd. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. May be ex-library. Shipping & Handling by region. Buy with confidence, excellent customer service!. Seller Inventory # 0387400923

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Pietsch, Ullrich; Holy, Vaclav; Baumbach, Tilo

Published by Springer

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer. Hardcover. Condition: New. 0387400923 Special order direct from the distributor. Seller Inventory # ING9780387400921

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Ullrich Pietsch

Published by Springer (2004)

ISBN 10: 0387400923 ISBN 13: 9780387400921

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About this Item: Springer, 2004. Hardcover. Condition: New. 2nd. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. Buy with confidence, excellent customer service!. Seller Inventory # 0387400923n

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