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Joel P. Dunsmore

Published by Wiley (edition 1)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley (edition 1). Hardcover. Book Condition: Very Good. 1. Ship within 24hrs. 14 days return guarantee! APO/FPO addresses supported. Bookseller Inventory # 1119979552-8-1

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Dunsmore, Joel P.

Published by Wiley

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley. Hardcover. Book Condition: Fine. 1119979552 Clean and Unmarked Copy. Bookseller Inventory # TRD000099503

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Joel P. Dunsmore

Published by John Wiley Sons Inc, United States (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: John Wiley Sons Inc, United States, 2012. Hardback. Book Condition: New. 2. Aufl.. Language: English . Brand New Book. This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for RD and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques.The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: * Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure * Offers a detailed explanation of algorithms and mathematics behind measurements and error correction * Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader * Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave RD and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers.University researchers and graduate students in microwave design and test will also find this book of interest. Bookseller Inventory # AAH9781119979555

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Joel P. Dunsmore

Published by John Wiley Sons Inc, United States (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: John Wiley Sons Inc, United States, 2012. Hardback. Book Condition: New. 2. Aufl.. Language: English . Brand New Book. This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for RD and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: * Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure * Offers a detailed explanation of algorithms and mathematics behind measurements and error correction * Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader * Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave RD and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest. Bookseller Inventory # AAH9781119979555

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Joel P. Dunsmore

Published by Wiley 2012-09-14, Chichester, West Sussex, United Kingdom (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley 2012-09-14, Chichester, West Sussex, United Kingdom, 2012. hardback. Book Condition: New. Bookseller Inventory # 9781119979555

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Joel P. Dunsmore

Published by Wileyand#8211;Blackwell (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wileyand#8211;Blackwell, 2012. HRD. Book Condition: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Bookseller Inventory # FW-9781119979555

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Joel P. Dunsmore

Published by John Wiley & Sons Inc

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: John Wiley & Sons Inc. Hardback. Book Condition: new. BRAND NEW, Handbook of Microwave Component Measurements: with Advanced VNA Techniques, Joel P. Dunsmore, This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: * Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure * Offers a detailed explanation of algorithms and mathematics behind measurements and error correction * Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader * Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave R&D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest. Bookseller Inventory # B9781119979555

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Joel P. Dunsmore

Published by Wileyand#8211;Blackwell (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wileyand#8211;Blackwell, 2012. HRD. Book Condition: New. New Book.Shipped from US within 10 to 14 business days.THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Bookseller Inventory # IP-9781119979555

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Dunsmore, Joel P.

Published by Wiley (2017)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2017. Hardcover. Book Condition: Very Good. Great condition with minimal wear, aging, or shelf wear. This item is printed on demand. Bookseller Inventory # P021119979552

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Joel P. Dunsmore

Published by Wileyand#8211;Blackwell (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wileyand#8211;Blackwell, 2012. HRD. Book Condition: New. New Book. Delivered from our US warehouse in 10 to 14 business days. THIS BOOK IS PRINTED ON DEMAND.Established seller since 2000. Bookseller Inventory # IP-9781119979555

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Joel P. Dunsmore

Published by Wiley (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2012. Hardcover. Book Condition: New. book. Bookseller Inventory # M1119979552

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Dunsmore, Joel P.

Published by Wiley (2017)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2017. Hardcover. Book Condition: Like New. Almost new condition. This item is printed on demand. Bookseller Inventory # P011119979552

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ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Book Condition: Fine. Used book. May have cover wear and markings inside. Please do not buy used items expecting new suppliments. CD's, Access codes, or other suppliments are not included. Bookseller Inventory # 1119979552-LOCATION-22047

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Dunsmore, Joel P.

Published by Wiley (2017)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2017. Hardcover. Book Condition: New. Never used! This item is printed on demand. Bookseller Inventory # P111119979552

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JOEL P. DUNSMORE

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: 2012. Hardback. Book Condition: NEW. 9781119979555 This listing is a new book, a title currently in-print which we order directly and immediately from the publisher. Bookseller Inventory # HTANDREE0783547

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Dunsmore, Joel P.

Published by Wiley (2017)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2017. Hardcover. Book Condition: New. Never used! This item is printed on demand. Bookseller Inventory # 1119979552

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Dunsmore, Joel P.

Published by Wiley (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2012. Hardcover. Book Condition: New. Bookseller Inventory # INGM9781119979555

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Dunsmore, Joel P.

Published by John Wiley & Sons Inc (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: John Wiley & Sons Inc, 2012. Hardcover. Book Condition: Brand New. 2nd edition. 512 pages. 9.69x1.57x6.61 inches. In Stock. Bookseller Inventory # __1119979552

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Joel P. Dunsmore

Published by John Wiley Sons Inc, United States (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: John Wiley Sons Inc, United States, 2012. Hardback. Book Condition: New. 2. Aufl.. Language: English . This book usually ship within 10-15 business days and we will endeavor to dispatch orders quicker than this where possible. Brand New Book. This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for RD and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: * Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measure * Offers a detailed explanation of algorithms and mathematics behind measurements and error correction * Provides numerous illustrations (e.g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the reader * Written by the principle developer and designer of many of the measurement methods described This book will be an invaluable guide for RF and microwave RD and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest. Bookseller Inventory # LIE9781119979555

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ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Book Condition: New. This item is Print on Demand - Depending on your location, this item may ship from the US or UK. Bookseller Inventory # POD_9781119979555

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Dunsmore, Joel P.

Published by Wiley

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley. Hardcover. Book Condition: New. 1119979552 Special order direct from the distributor. Bookseller Inventory # ING9781119979555

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Joel P. Dunsmore

Published by Wiley

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley. Hardcover. Book Condition: New. Hardcover. 636 pages. Dimensions: 9.7in. x 6.6in. x 1.6in.This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R and D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and uncertainty analysis, this book provides everything you need to understand microwave measurements. With primary focus on active and passive measurements using a Vector Network Analyzer, these techniques and analysis are equally applicable to measurements made with Spectrum Analyzers or Noise Figure Analyzers. The early chapters provide a theoretical basis for measurements complete with extensive definitions and descriptions of component characteristics and measurement parameters. The latter chapters give detailed examples for cases of cable, connector and filter measurements; low noise, high-gain and high power amplifier measurements, a wide range of mixer and frequency converter measurements, and a full examination of fixturing, de-embedding, balanced measurements and calibration techniques. The chapter on time-domain theory and measurements is the most complete treatment on the subject yet presented, with details of the underlying mathematics and new material on time domain gating. As the inventor of many of the methods presented, and with 30 years as a development engineer on the most modern measurement platforms, the author presents unique insights into the understanding of modern measurement theory. Key Features: Explains the interactions between the device-under-test (DUT) and the measuring equipment by demonstrating the best practices for ascertaining the true nature of the DUT, and optimizing the time to set up and measureOffers a detailed explanation of algorithms and mathematics behind measurements and error correctionProvides numerous illustrations (e. g. block-diagrams for circuit connections and measurement setups) and practical examples on real-world devices, which can provide immediate benefit to the readerWritten by the principle developer and designer of many of the measurement methods describedThis book will be an invaluable guide for RF and microwave R and D and test engineers, satellite test engineers, radar engineers, power amplifier designers, LNA designers, and mixer designers. University researchers and graduate students in microwave design and test will also find this book of interest. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Hardcover. Bookseller Inventory # 9781119979555

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Joel P. Dunsmore

Published by Wiley (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: Wiley, 2012. Hardcover. Book Condition: Good. 1. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. Buy with confidence, excellent customer service!. Bookseller Inventory # 1119979552

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Joel P. Dunsmore

Published by John Wiley & Sons Inc (2012)

ISBN 10: 1119979552 ISBN 13: 9781119979555

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Item Description: John Wiley & Sons Inc, 2012. Book Condition: New. This item is printed on demand for shipment within 3 working days. Bookseller Inventory # LP9781119979555

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