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ISBN 10: 161503725X ISBN 13: 9781615037254

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From: GreatBookPrices (Columbia, MD, U.S.A.)

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Item Description: Book Condition: New. Bookseller Inventory # 12479590-n

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Failure Analysis Society, Electronic Device Failure Analysis Society

Published by ASM International, United States (2011)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, United States, 2011. Mixed media product. Book Condition: New. 6th Revised edition. Language: English . Brand New Book. This updated reference book, prepared by experts in their fields, contains dozens of articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips. Topic coverage includes: * Failure Analysis Process Flow * Failure Verification * Failure Modes and Failure Classification * Special Devices (MEMS, Optoelectronics, Passives) * Fault Localisation Techniques: Package Level (NDT) * Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods) * Deprocessing Imaging Techniques: Deprocessing * General Imaging Techniques * Local Deprocessing Imaging * Circuit Edit and Design Modification * Material Analysis Techniques * Reference Information: Important Topics for Semiconductor Devices * Failure Analysis Techniques Roadmap * Failure Analysis Operations and Management * Appendices: Failure Analysis Terms, Definitions, and Acronyms * Industry Standards. Bookseller Inventory # AAN9781615037254

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Failure Analysis Society, Electronic Device Failure Analysis Society

Published by ASM International, United States (2012)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, United States, 2012. Mixed media product. Book Condition: New. 6th Revised edition. Language: English . Brand New Book. This updated reference book, prepared by experts in their fields, contains dozens of articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips. Topic coverage includes: * Failure Analysis Process Flow * Failure Verification * Failure Modes and Failure Classification * Special Devices (MEMS, Optoelectronics, Passives) * Fault Localisation Techniques: Package Level (NDT) * Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods) * Deprocessing Imaging Techniques: Deprocessing * General Imaging Techniques * Local Deprocessing Imaging * Circuit Edit and Design Modification * Material Analysis Techniques * Reference Information: Important Topics for Semiconductor Devices * Failure Analysis Techniques Roadmap * Failure Analysis Operations and Management * Appendices: Failure Analysis Terms, Definitions, and Acronyms * Industry Standards. Bookseller Inventory # AAN9781615037254

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Failure Analysis Society, Electronic Device Failure Analysis Society

Published by ASM International

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International. Mixed media product. Book Condition: new. BRAND NEW, Microelectronics Failure Analysis Desk Reference (6th Revised edition), Failure Analysis Society, Electronic Device Failure Analysis Society, This updated reference book, prepared by experts in their fields, contains dozens of articles covering a wide range of topics involving the failure analysis of microelectronics. It places the most important and up-to-date information on this subject at your fingertips. Topic coverage includes: * Failure Analysis Process Flow * Failure Verification * Failure Modes and Failure Classification * Special Devices (MEMS, Optoelectronics, Passives) * Fault Localisation Techniques: Package Level (NDT) * Die Level (Depackaging, Photon Emission, Microthermography, Laser-Based Methods, Particle Beam Methods) * Deprocessing & Imaging Techniques: Deprocessing * General Imaging Techniques * Local Deprocessing & Imaging * Circuit Edit and Design Modification * Material Analysis Techniques * Reference Information: Important Topics for Semiconductor Devices * Failure Analysis Techniques Roadmap * Failure Analysis Operations and Management * Appendices: Failure Analysis Terms, Definitions, and Acronyms * Industry Standards. Bookseller Inventory # B9781615037254

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Electronic Device Failure Analysis Society

Published by ASM International (2012)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2012. UNK. Book Condition: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Bookseller Inventory # CE-9781615037254

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EDFAS Desk Reference Committee

Published by ASM International (2011)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2011. Hardcover. Book Condition: New. Bookseller Inventory # DADAX161503725X

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EDFAS Desk Reference Committee

Published by ASM International (2011)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2011. Hardcover. Book Condition: New. Never used!. Bookseller Inventory # P11161503725X

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EDFAS Desk Reference Committee

Published by ASM International (2011)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2011. Hardcover. Book Condition: Like New. Almost new condition. Bookseller Inventory # P01161503725X

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EDFAS Desk Reference Committee

Published by ASM International (2011)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2011. Hardcover. Book Condition: Very Good. Great condition with minimal wear, aging, or shelf wear. Bookseller Inventory # P02161503725X

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EDFAS DESK REFERENCE COMMITTEE

Published by ASM International (2012)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2012. Hardcover. Book Condition: Brand New. 6th edition edition. 674 pages. 11.02x8.50x1.73 inches. In Stock. Bookseller Inventory # __161503725X

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EDFAS Desk Reference Committee

Published by ASM International (2011)

ISBN 10: 161503725X ISBN 13: 9781615037254

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Item Description: ASM International, 2011. Hardcover. Book Condition: New. book. Bookseller Inventory # M161503725X

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Results (1 - 11) of 11