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Mario Birkholz

Published by Wiley 2005-11-15, Weinheim :|[Chichester (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Blackwell's (Oxford, OX, United Kingdom)

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About this Item: Wiley 2005-11-15, Weinheim :|[Chichester, 2005. hardback. Condition: New. Seller Inventory # 9783527310524

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Mario Birkholz

Published by Wiley-VCH (2006)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Ergodebooks (RICHMOND, TX, U.S.A.)

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About this Item: Wiley-VCH, 2006. Hardcover. Condition: Used: Good. Seller Inventory # SONG3527310525

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Mario Birkholz

Published by Wiley-VCH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

Hardcover
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From: Ergodebooks (RICHMOND, TX, U.S.A.)

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About this Item: Wiley-VCH, 2005. Hardcover. Condition: New. Seller Inventory # DADAX3527310525

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Birkholz, Mario

Published by Wiley VCH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Books2Anywhere (Fairford, GLOS, United Kingdom)

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About this Item: Wiley VCH, 2005. HRD. Condition: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Seller Inventory # FW-9783527310524

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Mario Birkholz

Published by Wiley VCH 2005-11-15 (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Chiron Media (Wallingford, United Kingdom)

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About this Item: Wiley VCH 2005-11-15, 2005. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 24-48 hours from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Seller Inventory # NU-LBR-01548049

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Birkholz, Mario

Published by Wiley-VCH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Murray Media (North Miami Beach, FL, U.S.A.)

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About this Item: Wiley-VCH, 2005. Hardcover. Condition: Very Good. Great condition with minimal wear, aging, or shelf wear. Seller Inventory # P023527310525

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Mario Birkholz

Published by Wiley-VCH Verlag GmbH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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About this Item: Wiley-VCH Verlag GmbH, 2005. Condition: New. Seller Inventory # L9783527310524

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Birkholz, Mario

Published by Wiley-VCH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Murray Media (North Miami Beach, FL, U.S.A.)

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About this Item: Wiley-VCH, 2005. Hardcover. Condition: New. Never used!. Seller Inventory # P113527310525

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Birkholz, Mario

Published by Wiley-VCH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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About this Item: Wiley-VCH, 2005. Hardcover. Condition: Like New. Almost new condition. Seller Inventory # P013527310525

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Mario Birkholz

Published by Wiley VCH Verlag Gmbh Okt 2005 (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Rheinberg-Buch (Bergisch Gladbach, Germany)

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About this Item: Wiley VCH Verlag Gmbh Okt 2005, 2005. Buch. Condition: Neu. Neuware - Whereas the X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner. 400 pp. Englisch. Seller Inventory # 9783527310524

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Mario Birkholz

Published by Wiley VCH Verlag Gmbh Okt 2005 (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: BuchWeltWeit Inh. Ludwig Meier e.K. (Bergisch Gladbach, Germany)

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About this Item: Wiley VCH Verlag Gmbh Okt 2005, 2005. Buch. Condition: Neu. Neuware - Whereas the X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner. 400 pp. Englisch. Seller Inventory # 9783527310524

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Birkholz, Mario/ Fewster, Paul F. (Contributor)/ Genzel, Christoph (Contributor)

Published by Vch Verlagsgesellschaft Mbh (2006)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Revaluation Books (Exeter, United Kingdom)

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About this Item: Vch Verlagsgesellschaft Mbh, 2006. Hardcover. Condition: Brand New. illustrated edition. 378 pages. 9.50x6.75x0.75 inches. In Stock. Seller Inventory # __3527310525

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Birkholz, Mario

Published by Wiley-VCH

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Ohmsoft LLC (Lake Forest, IL, U.S.A.)

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About this Item: Wiley-VCH. Condition: New. Hardcover. Worldwide shipping. FREE fast shipping inside USA (express 2-3 day delivery also available). Tracking service included. Ships from United States of America. Seller Inventory # 3527310525

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Mario Birkholz

Published by Wiley-VCH Verlag GmbH, Germany (2006)

ISBN 10: 3527310525 ISBN 13: 9783527310524

Hardcover
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From: The Book Depository EURO (London, United Kingdom)

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About this Item: Wiley-VCH Verlag GmbH, Germany, 2006. Hardback. Condition: New. 1. Auflage. Language: English . Brand New Book. With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films. Very much an interdisciplinary field, chemists, biochemists, materials scientists, physicists and engineers all have a common interest in thin films and their manifold uses and applications. Grain size, porosity, density, preferred orientation and other properties are important to know: whether thin films fulfill their intended function depends crucially on their structure and morphology once a chemical composition has been chosen. Although their backgrounds differ greatly, all the involved specialists a profound understanding of how structural properties may be determined in order to perform their respective tasks in search of new and modern materials, coatings and functions. The author undertakes this in-depth introduction to the field of thin film X-ray characterization in a clear and precise manner. Seller Inventory # AAH9783527310524

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Mario Birkholz

Published by Wiley-VCH (2005)

ISBN 10: 3527310525 ISBN 13: 9783527310524

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From: Books Express (Portsmouth, NH, U.S.A.)

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About this Item: Wiley-VCH, 2005. Hardcover. Condition: Good. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. May be ex-library. Shipping & Handling by region. Buy with confidence, excellent customer service!. Seller Inventory # 3527310525

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Results (1 - 15) of 15