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Dror Sarid

Published by Wiley-VCH (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley-VCH, 2007. Hardcover. Condition: Used: Good. Seller Inventory # SONG3527406174

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Sarid, Dror; Sarid, D.

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Condition: New. Seller Inventory # 3500872-n

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Dror Sarid

Published by Wiley 2007-01-02, Weinheim (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley 2007-01-02, Weinheim, 2007. hardback. Condition: New. Seller Inventory # 9783527406173

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Sarid, Dror

Published by Wiley VCH (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley VCH, 2007. HRD. Condition: New. New Book. Shipped from UK in 4 to 14 days. Established seller since 2000. Seller Inventory # FW-9783527406173

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Dror Sarid

Published by John Wiley and Sons

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: John Wiley and Sons. Condition: New. Brand New. Seller Inventory # 3527406174

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Dror Sarid

Published by Wiley-VCH (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley-VCH, 2007. Hardcover. Condition: New. 2nd, Revised and Enlarged Editio. Seller Inventory # DADAX3527406174

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Sarid, Dror

Published by Wiley-VCH (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley-VCH, 2007. Hardcover. Condition: New. Never used!. Seller Inventory # P113527406174

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Sarid, Dror

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: 2006. Condition: New. Seller Inventory # L9783527406173

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Dror Sarid

Published by Wiley VCH Verlag Gmbh Dez 2006 (2006)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley VCH Verlag Gmbh Dez 2006, 2006. Buch. Condition: Neu. Neuware - This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs. 310 pp. Englisch. Seller Inventory # 9783527406173

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Dror Sarid

Published by Wiley VCH Verlag Gmbh Dez 2006 (2006)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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From: Rheinberg-Buch (Bergisch Gladbach, Germany)

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About this Item: Wiley VCH Verlag Gmbh Dez 2006, 2006. Buch. Condition: Neu. Neuware - This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs. 310 pp. Englisch. Seller Inventory # 9783527406173

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Dror Sarid

Published by Wiley VCH Verlag Gmbh Dez 2006 (2006)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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From: BuchWeltWeit Inh. Ludwig Meier e.K. (Bergisch Gladbach, Germany)

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About this Item: Wiley VCH Verlag Gmbh Dez 2006, 2006. Buch. Condition: Neu. Neuware - This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs. 310 pp. Englisch. Seller Inventory # 9783527406173

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Dror Sarid

Published by Wiley VCH 2007-01-02 (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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From: Chiron Media (Wallingford, United Kingdom)

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About this Item: Wiley VCH 2007-01-02, 2007. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 24-48 hours from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely. Seller Inventory # NU-LBR-00761116

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Sarid, Dror

Published by Vch Verlagsgesellschaft Mbh (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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From: Revaluation Books (Exeter, United Kingdom)

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About this Item: Vch Verlagsgesellschaft Mbh, 2007. Hardcover. Condition: Brand New. 2nd hardback/cd-rom edition. 310 pages. 9.50x7.00x0.75 inches. In Stock. Seller Inventory # __3527406174

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Dror Sarid

Published by Wiley VCH Verlag Gmbh Dez 2006 (2006)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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From: AHA-BUCH GmbH (Einbeck, Germany)

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About this Item: Wiley VCH Verlag Gmbh Dez 2006, 2006. Buch. Condition: Neu. Neuware - This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs. 310 pp. Englisch. Seller Inventory # 9783527406173

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Dror Sarid

Published by Wiley-VCH (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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From: Irish Booksellers (Portland, ME, U.S.A.)

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About this Item: Wiley-VCH, 2007. Hardcover. Condition: New. book. Seller Inventory # M3527406174

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Dror Sarid

Published by Wiley-VCH (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley-VCH, 2007. Hardcover. Condition: Good. 2. Ships with Tracking Number! INTERNATIONAL WORLDWIDE Shipping available. May not contain Access Codes or Supplements. May be ex-library. Shipping & Handling by region. Buy with confidence, excellent customer service!. Seller Inventory # 3527406174

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Dror Sarid

Published by Wiley-VCH Verlag GmbH, Germany (2007)

ISBN 10: 3527406174 ISBN 13: 9783527406173

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About this Item: Wiley-VCH Verlag GmbH, Germany, 2007. Hardback. Condition: New. 2nd revised and enlarged ed. Language: English . Brand New Book. This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs. Seller Inventory # AAH9783527406173

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Results (1 - 17) of 17