Results (1 - 1) of 1

Show results for

Product Type

  • All Product Types
  • Books (1)
  • Magazines & Periodicals
  • Comics
  • Sheet Music
  • Art, Prints & Posters
  • Photographs
  • Maps
  • Manuscripts &
    Paper Collectibles

Refine by

Condition

Binding

Collectible Attributes

  • First Edition
  • Signed
  • Dust Jacket
  • Seller-Supplied Images
  • Not Printed On Demand

Seller Location

  • All Locations

Seller Rating

Parag K Lala

Published by BS Pub, Hyderabad (2008)

ISBN 10: 8178001853 ISBN 13: 9788178001852

Used
Softcover

Quantity Available: 1

From: Vedams eBooks (P) Ltd (New Delhi, India)

Seller Rating: 3-star rating

Add to Basket
Price: US$ 52.50
Convert Currency
Shipping: US$ 16.28
From India to U.S.A.

Destination, Rates & Speeds

About this Item: BS Pub, Hyderabad, 2008. Hardbound. Condition: As New. Reprint. Contents 1. Basic concepts of reliability. 2. Faults in digital circuits. 3. Test generation. 4. Fault tolerant design of digital systems. 5. Self checking and fail safe logic. 6. Design for testability. 7. Conclusion. Appendix Markov Models. Reference. Annotated bibliography. Index. Fault Tolerance and Testability have the common objective of improving the reliability of computer hardware. This book has been written for the students of Electrical Engineering and Computer Sciences. Chapter 1 deals with the basics of reliability theory chapter 2 covers most of the important faults chapter 3 about fault detection chapter 4 discusses many classes of hardware fault tolerance techniques chapter 5 presents recent developments chapter 6 focuses on various design techniques and chapter 7 highlights the current research issues. The entire text is prepared in lucid language with sufficient basic techniques and examples for easy understanding. Features A systematic study of the various fault tolerant architectures in use. An in depth review of the basic characteristics of self checking logic detailed descriptions of all the major hardware techniques that may be used in fault tolerant and testable design. Comparisons of the various possible techniques for dealing with a problem and assessment of their suitability in various situations. Sections on the fault tolerant design of VLSI chips and state of the art problems still being researched over 200 line drawings and tables. Extensive references at the end of each chapter to facilitate further reading on specialist topics. An annotated bibliography listing textbooks journal articles and conference proceedings on the subject. 264 pp. Seller Inventory # 75300

More information about this seller | Contact this seller 1.

Results (1 - 1) of 1