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Advanced Materials Characterization by Kumar Sateesh (39 results)
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Advanced Materials Characterization
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Advanced Materials Characterization
Language: English
Published by Taylor and Francis Ltd, GB, 2024
ISBN 10: 1032375116 ISBN 13: 9781032375113
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 69.85
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US$ 69.74
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Add to basketpaperback. Condition: New.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Language: English
Published by Taylor & Francis Ltd, 2024
ISBN 10: 1032375116 ISBN 13: 9781032375113
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 73.31
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Add to basketPaperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
First Edition
Condition: New. 2024. 1st Edition. paperback. . . . . .
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Condition: New. 2024. 1st Edition. paperback. . . . . . Books ship from the US and Ireland.
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US$ 105.88
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Add to basketPaperback. Condition: Brand New. 144 pages. 9.18x6.12x9.21 inches. In Stock.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Condition: As New. Unread book in perfect condition.
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Advanced Materials Characterization
Language: English
Published by Taylor and Francis Ltd, GB, 2024
ISBN 10: 1032375116 ISBN 13: 9781032375113
US$ 75.43
US$ 87.63 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering.
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Condition: New. 1st edition NO-PA16APR2015-KAP.
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Taschenbuch. Condition: Neu. Advanced Materials Characterization | Basic Principles, Novel Applications, and Future Directions | Ch Sateesh Kumar (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2024 | CRC Press | EAN 9781032375113 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Language: English
Published by Taylor & Francis Ltd, 2023
ISBN 10: 1032375108 ISBN 13: 9781032375106
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 180.69
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Add to basketHardback. Condition: New. New copy - Usually dispatched within 4 working days.
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 179.07
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Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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US$ 179.69
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Add to basketCondition: As New. Unread book in perfect condition.
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Advanced Materials Characterization (Advanced Materials Processing and Manufacturing)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
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US$ 262.69
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Add to basketHardcover. Condition: Brand New. 160 pages. 9.19x6.13x0.52 inches. In Stock.
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Advanced Materials Characterization (Paperback)
Language: English
Published by Taylor & Francis Ltd, London, 2024
ISBN 10: 1032375116 ISBN 13: 9781032375113
Paperback. Condition: new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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US$ 85.08
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Add to basketPaperback. Condition: Brand New. 144 pages. 9.18x6.12x9.21 inches. In Stock. This item is printed on demand.
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Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions
Language: English
Published by Taylor & Francis Ltd, 2024
ISBN 10: 1032375116 ISBN 13: 9781032375113
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 91.55
US$ 21.23 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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Advanced Materials Characterization (Paperback)
Language: English
Published by Taylor & Francis Ltd, London, 2024
ISBN 10: 1032375116 ISBN 13: 9781032375113
US$ 65.94
US$ 49.88 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
