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Advanced Scanning Electron Microscopy by Echlin Patrick (21 results)
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Seller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Oct. 27 (SALE ITEM)* Second printing, 454 pp., hardcover, ex library, else text clean and binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by Springer, New York, NY, 1986
ISBN 10: 0306421402 ISBN 13: 9780306421402
Language: English
Hard cover. 1986 ed. Sewn binding. Cloth over boards. 454 p. Contains: Illustrations, black & white. Audience: General/trade. Very good. No dust jacket. light shelfwear po name inside cover.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Seller: Better World Books Ltd, Dunfermline, United Kingdom
Seller rating 5 out of 5 stars
First Edition
US$ 8.88
Convert currencyUS$ 10.65 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. 1st Edition. Ships from the UK. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Hardcover. Condition: New.
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Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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US$ 85.61
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Add to basketBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Condition: New. pp. xii + 454.
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US$ 97.61
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Add to basketCondition: New. pp. xii + 454.
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US$ 105.03
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Add to basketCondition: New. pp. xii + 454.
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US$ 116.90
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Add to basketCondition: New.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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US$ 142.17
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Add to basketBrand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 129.04
Convert currencyUS$ 15.94 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 110.50
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US$ 179.62
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Add to basketPaperback. Condition: Brand New. reprint edition. 466 pages. 8.75x6.00x0.75 inches. In Stock.
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US$ 136.95
Convert currencyUS$ 73.74 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
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US$ 244.02
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Add to basketHardcover. Condition: Very Good. Very Good. Ships from Multiple Locations. book.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by Springer, Springer Jun 2013, 2013
ISBN 10: 1475790295 ISBN 13: 9781475790290
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 128.13
Convert currencyUS$ 26.74 shipping from Germany to U.S.A.Quantity: 2 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. 476 pp. Englisch.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by Springer-Verlag New York Inc., 2013
ISBN 10: 1475790295 ISBN 13: 9781475790290
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 157.20
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 661.
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Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by Springer US, Springer New York Jun 2013, 2013
ISBN 10: 1475790295 ISBN 13: 9781475790290
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
US$ 128.13
Convert currencyUS$ 69.76 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 476 pp. Englisch.
