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Autotestcon by Ieee Internationational Automatic Testing Conference (1 results)
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AutoTestCon '82 - IEEE Internationational Automatic Testing Conference, 12-14 October 1982, Dayton, Ohio
Published by IEEE; The Institute of Electrical and Electronics Engineers, Inc., New York, NY, U.S.A., 1982
First Edition
Hardcover. Condition: Very Good. No Jacket. 1st. With library markings and labels. Will not fit in Flat Rate Priority Mail envelope. Size: 4to. Ex-Library.
