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Defect Complexes Semiconductor Structures (15 results)
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Softcover. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-00465 3540119868 Sprache: Englisch Gewicht in Gramm: 550.
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Defect Complexes in Semiconductor Structures. Proceedings of the International School Held in Mátrafüred, Hungary September 13-17, 1982.
Published by Berlin, Springer Berlin Heidelberg, 1983
ISBN 10: 3540119868 ISBN 13: 9783540119869
Language: English
Softcover. 311 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library with stamp and library-signature. GOOD condition, some traces of use. 3540119868 Sprache: Englisch Gewicht in Gramm: 550.
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Defect Complexes in Semiconductor Structures: Proceedings of the International School Held in Mátrafüred, Hungary, September 13 - 17, 1982 (Lecture Notes in Physics, 175)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 127.46
US$ 15.75 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 320.
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Paperback. Condition: Brand New. spiral-bound edition. 317 pages. 9.61x6.70x0.73 inches. In Stock.
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Taschenbuch. Condition: Neu. Defect Complexes in Semiconductor Structures | Proceedings of the International School Held in Mátrafüred, Hungary, September 13 - 17, 1982 | J. Giber (u. a.) | Taschenbuch | vi | Englisch | 1983 | Springer | EAN 9783540119869 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Defect Complexes in Semiconductor Structures : Proceedings of the International School Held in Mátrafüred, Hungary, September 13 ¿ 17, 1982
Published by Springer Berlin Heidelberg, 1983
ISBN 10: 3540119868 ISBN 13: 9783540119869
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering.
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Defect Complexes in Semiconductor Structures : Proceedings of the International School Held in Mátrafüred, Hungary, September 13 ¿ 17, 1982
Published by Springer Berlin Heidelberg, 1983
ISBN 10: 3540119868 ISBN 13: 9783540119869
Language: English
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Paperback. Condition: Very Good. Dust Jacket may NOT BE INCLUDED.CDs may be missing. SHIPS FROM MULTIPLE LOCATIONS. book.
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Defect Complexes in Semiconductor Structures
Published by Springer, Springer Berlin Heidelberg Feb 1983, 1983
ISBN 10: 3540119868 ISBN 13: 9783540119869
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -A technologist's view on defects.- Characterization of impurities and defects by electron paramagnetic resonance and related techniques.- Review of the possibilities of electron microscopy in the identification of defect structures.- Electrical and optical measuring techniques for flaw states.- Theory of defect complexes.- Critical comparison of the theoretical models for anomalous large lattice relaxation in III-V compounds.- Vacancy related structure defects in SiO2 - Cyclic cluster calculations compared with experimental results.- A new model for the Si-A center.- Defect complexing in iron-doped silicon.- Photoluminescence of defect complexes in silicon.- Electron microscopical analysis of the stacking fault behaviour in inert-gas annealed Czochralski silicon.- Oxygen precipitation and the generation of secondary defects in oxygen-rich silicon.- Electrical and optical properties of oxygen-related donors in silicon formed at temperatures from 600 to 850 °c.- On the field dependence of capture and emission processes at deep centres.- Lattice matched heterolayers.- Compositional transition layers in heterostructure.- Defect complexes in III-V compounds.- Low frequency current oscillations due to electron retrapping by the AsGa antisite defect in GaAs.- Main electron traps in gaas: Aggregates of antisite defects.- Defect reactions in gap caused by zinc diffusion.- Nonstatistical defect surroundings in mixed crystals - the selfactivated luminescence centre in ZnSxSe1-x.- Structure and properties of the Si-SiO2 interregion.- Radiation defects of the semiconductor-insulator interface.- Analysis of Si/SiO2 interface defects by the method of term spectroscopy.- Theoretical aspects of laser annealing.- Radiation methods for creation of heterostructures on silicon.-Ion beam gettering in GaP.- Panel discussion.- Mechanical stress induced defect creation in GaP. 320 pp. Englisch.
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Defect Complexes in Semiconductor Structures
Published by Springer Berlin Heidelberg, 1983
ISBN 10: 3540119868 ISBN 13: 9783540119869
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. A technologist s view on defects.- Characterization of impurities and defects by electron paramagnetic resonance and related techniques.- Review of the possibilities of electron microscopy in the identification of defect structures.- Electrical and optical .
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Condition: New. Print on Demand pp. 320 67:B&W 6.69 x 9.61 in or 244 x 170 mm (Pinched Crown) Perfect Bound on White w/Gloss Lam.
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Condition: New. PRINT ON DEMAND pp. 320.
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Defect Complexes in Semiconductor Structures
Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Feb 1983, 1983
ISBN 10: 3540119868 ISBN 13: 9783540119869
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 320 pp. Englisch.
