Published by Reading, MA, U.S.A.: Addison-Wesley Educational Publishers, Incorporated, 1985, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Language: English
Seller: Bingo Used Books, Vancouver, WA, U.S.A.
Hardcover. Condition: Very Good. Hardcover in very good + condition.
Published by HarperCollins Publishers, 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Language: English
Seller: HPB-Red, Dallas, TX, U.S.A.
hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Published by Reading, MA, U.S.A. : Addison-Wesley Educational Publishers,., 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Language: English
Seller: Virginia Martin, aka bookwitch, Concord, CA, U.S.A.
Condition: Very Good. Octavo, hardcover, near fine in white pictorial boards. Clean and unmarked. 414 pp New algorithms are being devised to create tests for logic circuits, and more attention is being given to design for test techniques. In this comprehensive volume the state of the art in digital system design and testing is discussed. (as per 1985). Book.
Published by Somerset, New Jersey, U.S.A.: John Wiley & Sons Inc, 1986
ISBN 10: 0471603651 ISBN 13: 9780471603658
Language: English
Seller: Bingo Used Books, Vancouver, WA, U.S.A.
Hardcover. Condition: Very Good. hardcover in very good + condition.
Published by John Wiley & Sons Inc, 1986
ISBN 10: 0471603651 ISBN 13: 9780471603658
Language: English
Seller: HPB-Red, Dallas, TX, U.S.A.
Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
US$ 26.35
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Add to basketCondition: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In poor condition, suitable as a reading copy. No dust jacket. Water damaged. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
US$ 26.35
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Add to basketCondition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Book contains pencil markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:0060444444.
Published by Harper & Row, New York, 1985
ISBN 10: 0060444444 ISBN 13: 9780060444440
Seller: Between the Covers-Rare Books, Inc. ABAA, Gloucester City, NJ, U.S.A.
First Edition
Hardcover. Condition: Fine. First edition. Near fine. Spine darkened just a little.
Published by Longman Higher Education, 1986
ISBN 10: 0060444444 ISBN 13: 9780060444440
Language: English
Seller: Ammareal, Morangis, France
US$ 71.03
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Add to basketHardcover. Condition: Moyen. Ancien livre de bibliothèque. Traces d'usure sur la couverture. Edition 1986. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Acceptable. Former library book. Signs of wear on the cover. Edition 1986. Ammareal gives back up to 15% of this item's net price to charity organizations.
US$ 107.77
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Add to basketHardcover. Condition: Acceptable. Acceptable. book.
US$ 212.74
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US$ 211.40
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US$ 210.12
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US$ 223.99
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Add to basketCondition: New. In.
Published by John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Language: English
Seller: Grand Eagle Retail, Fairfield, OH, U.S.A.
Hardcover. Condition: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Published by John Wiley & Sons Inc, New York, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Language: English
Seller: CitiRetail, Stevenage, United Kingdom
US$ 210.14
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Add to basketHardcover. Condition: new. Hardcover. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Yet, as digital systems become more ubiquitous and complex, the challenge of testing them has become more difficult. As one development group designing a RISC stated, "the work required to . . . test a chip of this size approached the amount of effort required to design it." A valued reference for nearly two decades, Digital Logic Testing and Simulation has been significantly revised and updated for designers and test engineers who must meet this challenge. There is no single solution to the testing problem. Organized in an easy-to-follow, sequential format, this Second Edition familiarizes the reader with the many different strategies for testing and their applications, and assesses the strengths and weaknesses of the various approaches. The book reviews the building blocks of a successful testing strategy and guides the reader on choosing the best solution for a particular application. Digital Logic Testing and Simulation, Second Edition covers such key topics as: * Binary Decision Diagrams (BDDs) and cycle-based simulation * Tester architectures/Standard Test Interface Language (STIL) * Practical algorithms written in a Hardware Design Language (HDL) * Fault tolerance * Behavioral Automatic Test Pattern Generation (ATPG) * The development of the Test Design Expert (TDX), the many obstacles encountered and lessons learned in creating this novel testing approach Up-to-date and comprehensive, Digital Logic Testing and Simulation is an important resource for anyone charged with pinpointing faulty products and assuring quality, safety, and profitability. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
US$ 325.76
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Add to basketHardcover. Condition: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock.
Published by John Wiley and Sons Ltd, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Language: English
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
US$ 356.22
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Add to basketCondition: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . .
US$ 413.00
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Add to basketCondition: As New. Unread book in perfect condition.
US$ 402.04
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Add to basketHardcover. Condition: Like New. Like New. book.
Published by John Wiley and Sons Ltd, 2003
ISBN 10: 0471439959 ISBN 13: 9780471439950
Language: English
Seller: Kennys Bookstore, Olney, MD, U.S.A.
US$ 420.62
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Add to basketCondition: New. Your road map for meeting today's digital testing challenges Today, digital logic devices are common in products that impact public safety, including applications in transportation and human implants. Accurate testing has become more critical to reliability, safety, and the bottom line. Num Pages: 696 pages, Illustrations. BIC Classification: TJ. Category: (P) Professional & Vocational. Dimension: 243 x 165 x 43. Weight in Grams: 1130. . 2003. 2nd Edition. Hardcover. . . . . Books ship from the US and Ireland.
US$ 432.69
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Add to basketCondition: As New. Unread book in perfect condition.
Seller: Revaluation Books, Exeter, United Kingdom
US$ 302.54
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Add to basketHardcover. Condition: Brand New. 2nd edition. 668 pages. 9.50x6.50x1.25 inches. In Stock. This item is printed on demand.