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International EditionCondition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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Functional Verification of Programmable Embedded Architectures: A Top Down Approach
Published by Springer Nature (Sie), 2008
ISBN 10: 8181288653 ISBN 13: 9788181288653
Language: English
US$ 15.57
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Add to basketSoft cover. Condition: New. ISBN:9788181288653.
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Condition: New. pp. 202.
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US$ 27.41
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Add to basketCondition: New. pp. 202 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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US$ 30.64
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Add to basketCondition: New. pp. 202.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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US$ 116.06
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US$ 116.44
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Functional Verification of Programmable Embedded Architectures: A Top-Down Approach
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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US$ 134.71
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Functional Verification of Programmable Embedded Architectures: A Top-Down Approach
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 134.71
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US$ 127.83
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Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.
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US$ 131.50
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Add to basketCondition: Sehr gut. Zustand: Sehr gut - Gepflegter, sauberer Zustand. | Seiten: 180 | Sprache: Englisch | Produktart: Bücher.
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US$ 137.95
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Add to basketGebunden. Condition: New. Includes the latest studies/statistics on both verification complexity and design failuresProvides a complete view of the existing specification languages for programmable architecturesDemonstrates the development of functional fault models.
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US$ 168.99
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US$ 189.05
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Functional Verification of Programmable Embedded Architectures : A Top-Down Approach
Published by Springer Us Jul 2005, 2005
ISBN 10: 0387261435 ISBN 13: 9780387261430
Language: English
US$ 189.45
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Add to basketBuch. Condition: Neu. Neuware - It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems.
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US$ 139.79
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Add to basketHardcover. Condition: New. ISBN:9780387261430.
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Functional Verification of Programmable Embedded Architectures
Published by Springer US Dez 2014, 2014
ISBN 10: 1489973362 ISBN 13: 9781489973368
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
US$ 124.40
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Add to basketTaschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -It is widely acknowledged that the cost of validation and testing comprises a s- nificant percentage of the overall development costs for electronic systems today, and is expected to escalate sharply in the future. Many studies have shown that up to 70% of the design development time and resources are spent on functional verification. Functional errors manifest themselves very early in the design flow, and unless they are detected up front, they can result in severe consequence- both financially and from a safety viewpoint. Indeed, several recent instances of high-profile functional errors (e. g. , the Pentium FDIV bug) have resulted in - creased attention paid to verifying the functional correctness of designs. Recent efforts have proposed augmenting the traditional RTL simulation-based validation methodology with formal techniques in an attempt to uncover hard-to-find c- ner cases, with the goal of trying to reach RTL functional verification closure. However, what is often not highlighted is the fact that in spite of the tremendous time and effort put into such efforts at the RTL and lower levels of abstraction, the complexity of contemporary embedded systems makes it difficult to guarantee functional correctness at the system level under all possible operational scenarios. The problem is exacerbated in current System-on-Chip (SOC) design meth- ologies that employ Intellectual Property (IP) blocks composed of processor cores, coprocessors, and memory subsystems. Functional verification becomes one of the major bottlenecks in the design of such systems. 200 pp. Englisch.
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US$ 107.29
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Includes the latest studies/statistics on both verification complexity and design failuresProvides a complete view of the existing specification languages for programmable architecturesDemonstrates the development of functional fault models.
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Functional Verification of Programmable Embedded Architectures: A Top-Down Approach
Published by Springer-Verlag New York Inc., 2014
ISBN 10: 1489973362 ISBN 13: 9781489973368
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 156.54
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Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 314.
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Functional Verification of Programmable Embedded Architectures: A Top-Down Approach
Published by Springer-Verlag New York Inc., 2005
ISBN 10: 0387261435 ISBN 13: 9780387261430
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 156.54
Convert currencyUS$ 15.53 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 484.
