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Mos Interface Physics Process by Wang Shengkai (34 results)
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Mos Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
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Mos Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
Language: English
Published by Taylor & Francis Ltd, 2021
ISBN 10: 103210628X ISBN 13: 9781032106281
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MOS Interface Physics, Process and Characterization
Language: English
Published by CRC Press 2021-10-05, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
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MOS Interface Physics, Process and Characterization 1st Edition
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Published by H N H International Limited, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
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MOS Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization
Language: English
Published by Taylor & Francis Ltd, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
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MOS Interface Physics, Process and Characterization 1st Edition
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Published by H N H International Limited, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
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MOS Interface Physics, Process and Characterization
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MOS Interface Physics, Process and Characterization 1st Edition
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Published by H N H International Limited, 2021
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MOS Interface Physics, Process and Characterization
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Shengkai Wang is a professor in the Institute of Microelectronics, Chinese Academy of Sciences. He received Ph.D. from the University of Tokyo in 2011 and has been engaged in Ge, III-V, SiC in MOS technology. He has published more than 1.
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MOS Interface Physics, Process and Characterization
Language: English
Published by Taylor & Francis Ltd, 2021
ISBN 10: 1032106271 ISBN 13: 9781032106274
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
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MOS Interface Physics, Process and Characterization
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HRD. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Taschenbuch. Condition: Neu. MOS Interface Physics, Process and Characterization | Shengkai Wang (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2024 | CRC Press | EAN 9781032106281 | Verantwortliche Person für die EU: Libri GmbH, Europaallee 1, 36244 Bad Hersfeld, gpsr[at]libri[dot]de | Anbieter: preigu Print on Demand.
