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Ion beam surface layer analysis;: Proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by ... Science Foundation and the IBM Corporation - Hardcover
These proceedings originally published in THIN SOLID FILMS edited by Siddall and Zemel
"synopsis" may belong to another edition of this title.
- PublisherElsevier Sequoia S. A.
- Publication date1974
- ISBN 10 044419536X
- ISBN 13 9780444195364
- BindingHardcover
- Number of pages463
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Ion Beam Surface Layer Analysis (conference proceedings)
Published by
Elsevier Sequoia S. A.
(1974)
ISBN 10: 044419536X
ISBN 13: 9780444195364
Used
Hardcover
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Book Description Hardcover. Condition: UsedGood. Proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and Sponsored by the National Science Foundation and the IBM Corporation. Hardcover; surplus library copy with the usual stampings; reference number taped to spine; bar code and checkout sheet taped to front cover; fading and shelf wear to exterior; in good condition with clean text and tight binding. Seller Inventory # 87851
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Stock Image
Ion beam surface layer analysis;: Proceedings of the International Conference held on June 18-20, 1973, in Yorktown Heights, N.Y., and sponsored by . Science Foundation and the IBM Corporation
Published by
Elsevier Sequoia S. A.
(1974)
ISBN 10: 044419536X
ISBN 13: 9780444195364
Used
Hardcover
Quantity: 1
Seller:
Rating
Book Description hardcover. Condition: Good. Good. book. Seller Inventory # D8S0-3-M-044419536X-3
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US$ 133.58
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