Ionizing Radiation Effects in MOS Devices and Circuits

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9780471848936: Ionizing Radiation Effects in MOS Devices and Circuits
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The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process-induced radiation effects in the fabrication of high-density circuits. Reviews the history of radiation-hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation-hardness research.

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T. P. Ma and Paul V. Dressendorfer are the authors of Ionizing Radiation Effects in MOS Devices and Circuits, published by Wiley.

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Book Description John Wiley & Sons Inc, United States, 1989. Hardback. Condition: New. Language: English. Brand new Book. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research. Seller Inventory # LHB9780471848936

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Published by John Wiley & Sons Inc, United States (1989)
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Book Description John Wiley & Sons Inc, United States, 1989. Hardback. Condition: New. Language: English. Brand new Book. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research. Seller Inventory # AAH9780471848936

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Ma, T. P.; Dressendorfer, Paul V.
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Book Description John Wiley & Sons Inc, United States, 1989. Hardback. Condition: New. Language: English. Brand new Book. The first comprehensive overview describing the effects of ionizing radiation on MOS devices, as well as how to design, fabricate, and test integrated circuits intended for use in a radiation environment. Also addresses process--induced radiation effects in the fabrication of high--density circuits. Reviews the history of radiation--hard technology, providing background information for those new to the field. Includes a comprehensive review of the literature and an annotated listing of research activities in radiation--hardness research. Seller Inventory # AAH9780471848936

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T. P Ma, Paul V Dressendorfer
Published by Wiley 1989-06-07, New York |Chichester (1989)
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