Items related to Defects in SiO2 and Related Dielectrics: Science and...
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2) - Softcover
Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy.
"synopsis" may belong to another edition of this title.
- PublisherSpringer
- Publication date2000
- ISBN 10 0792366867
- ISBN 13 9780792366867
- BindingPaperback
- Number of pages632
- EditorPacchioni Gianfranco, Skuja Linards, Griscom David L.
Buy New
Learn more about this copy
US$ 216.24
Shipping:
FREE
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology (Nato Science Series II:) [Paperback ]
Seller:
Rating
Book Description Soft Cover. Condition: new. Seller Inventory # 9780792366867
Buy New
US$ 216.24
Convert currency
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Published by
Springer
(2000)
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Feb2416190183931
Buy New
US$ 230.72
Convert currency
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer Netherlands
(2000)
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Kartoniert / Broschiert
Quantity: > 20
Seller:
Rating
Book Description Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Proceedings of the NATO Advanced Study Institute, Erice, Italy, April 8-20, 2000 Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-ox. Seller Inventory # 5969608
Buy New
US$ 197.60
Convert currency
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer
(2000)
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9780792366867_lsuk
Buy New
US$ 239.70
Convert currency
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer Netherlands Dez 2000
(2000)
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. 636 pp. Englisch. Seller Inventory # 9780792366867
Buy New
US$ 234.82
Convert currency
Seller Image
Defects in SiO2 and Related Dielectrics: Science and Technology
Published by
Springer Netherlands
(2000)
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Silicon dioxide plays a central role in most contemporary electronic and photonic technologies, from fiber optics for communications and medical applications to metal-oxide-semiconductor devices. Many of these applications directly involve point defects, which can either be introduced during the manufacturing process or by exposure to ionizing radiation. They can also be deliberately created to exploit new technologies. This book provides a general description of the influence that point defects have on the global properties of the bulk material and their spectroscopic characterization through ESR and optical spectroscopy. Seller Inventory # 9780792366867
Buy New
US$ 238.12
Convert currency
Stock Image
Defects in SiO2 and Related Dielectrics: Science and Technology (NATO Science Series II: Mathematics, Physics and Chemistry, 2)
Seller:
Rating
Book Description Condition: New. Buy with confidence! Book is in new, never-used condition. Seller Inventory # bk0792366867xvz189zvxnew
Buy New
US$ 305.97
Convert currency
Stock Image
Defects in Si02 and Related Dielectrics: Science and Technology
Published by
Kluwer Academic Pub
(2000)
ISBN 10: 0792366867
ISBN 13: 9780792366867
New
Paperback
Quantity: 2
Seller:
Rating
Book Description Paperback. Condition: Brand New. 632 pages. 9.50x6.50x1.50 inches. In Stock. Seller Inventory # x-0792366867
Buy New
US$ 293.65
Convert currency