Items related to Metrology, Inspection, And Process Control for Microlithogra...
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
"synopsis" may belong to another edition of this title.
- PublisherSociety of Photo Optical
- Publication date2005
- ISBN 10 0819457329
- ISBN 13 9780819457325
- BindingPaperback
- Number of pages1474
- EditorSilver Richard M.
Buy New
Learn more about this copy
US$ 150.00
Shipping:
US$ 4.97
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Stock Image
Metrology, Inspection, And Process Control for Microlithography 19
Published by
Society of Photo Optical
(2005)
ISBN 10: 0819457329
ISBN 13: 9780819457325
New
Soft cover
Quantity: 1
Seller:
Rating
Book Description Soft cover. Condition: New. 3 Brand new Volumes complete in factory sealed plastic. New!. Seller Inventory # 059226
Buy New
US$ 150.00
Convert currency