Synopsis
These proceedings cover developments in imaging, diffraction and spectroscopy in the electron microscope, together complementary and competing techniques such as scanning optical and scanning stylus microscopies.
A valuable reference source for researchers involved in the use of electron microscopy in physics, materials science and chemistry.
Review
"... a useful review of the state of the art in microscopy and microanalysis covering the use of SEM, TEM, STEM, STM and AFM instruments to both image samples and to analyse their structures." -- Dr D J Bate, Contemporary Physics, Volume 36, Number 4, July/August 1995
"...these proceedings provide a very impressive survey for all those working in the field of material science, electron microscopy and analysis..." -- G Wagner, Crystal Research and Technology, 30, 1995, 8, 1108
"These proceedings containing condensed articles are of such high interest and less ephemeral than most. The 1993 vintage was certainly excellent. The high quality of the EMAG proceedings is well known and is certainly maintained in this volume." (P. W. Hawkes, Ultramicroscopy, 56 (1994) p.348) -- P.W. Hawkes, Ultramicroscopy
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