Defect and Fault Tolerance in VLSI Systems: Volume 1 - Softcover
This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized.
"synopsis" may belong to another edition of this title.
- PublisherSpringer
- Publication date2012
- ISBN 10 1461568013
- ISBN 13 9781461568018
- BindingPaperback
- Number of pages374
Buy New
Learn more about this copy
US$ 112.87
Shipping:
FREE
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Seller Image
Defect and Fault Tolerance in VLSI Systems: Volume 1 by Koren, Israel [Paperback ]
Seller:
Rating
Book Description Soft Cover. Condition: new. Seller Inventory # 9781461568018
Buy New
US$ 112.87
Convert currency
Stock Image
Defect and Fault Tolerance in VLSI Systems: Volume 1
Published by
Springer
(2012)
ISBN 10: 1461568013
ISBN 13: 9781461568018
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Mar2716030037922
Buy New
US$ 116.64
Convert currency
Seller Image
Defect and Fault Tolerance in VLSI Systems
Published by
Springer US Jun 2012
(2012)
ISBN 10: 1461568013
ISBN 13: 9781461568018
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized. 380 pp. Englisch. Seller Inventory # 9781461568018
Buy New
US$ 106.19
Convert currency
Stock Image
Defect and Fault Tolerance in VLSI Systems: Volume 1
Published by
Springer
(2012)
ISBN 10: 1461568013
ISBN 13: 9781461568018
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781461568018_lsuk
Buy New
US$ 124.06
Convert currency
Stock Image
Defect and Fault Tolerance in VLSI Systems: Volume 1
Seller:
Rating
Book Description PF. Condition: New. Seller Inventory # 6666-IUK-9781461568018
Buy New
US$ 117.94
Convert currency
Seller Image
Defect and Fault Tolerance in VLSI Systems
Published by
Springer US
(2012)
ISBN 10: 1461568013
ISBN 13: 9781461568018
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of . Seller Inventory # 4200161
Buy New
US$ 101.76
Convert currency
Seller Image
Defect and Fault Tolerance in VLSI Systems : Volume 1
Published by
Springer US
(2012)
ISBN 10: 1461568013
ISBN 13: 9781461568018
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book contains an edited selection of papers presented at the International Workshop on Defect and Fault Tolerance in VLSI Systems held October 6-7, 1988 in Springfield, Massachusetts. Our thanks go to all the contributors and especially the members of the program committee for the difficult and time-consuming work involved in selecting the papers that were presented in the workshop and reviewing the papers included in this book. Thanks are also due to the IEEE Computer Society (in particular, the Technical Committee on Fault-Tolerant Computing and the Technical Committee on VLSI) and the University of Massachusetts at Amherst for sponsoring the workshop, and to the National Science Foundation for supporting (under grant number MIP-8803418) the keynote address and the distribution of this book to all workshop attendees. The objective of the workshop was to bring t. ogether researchers and practition ers from both industry and academia in the field of defect tolerance and yield en ha. ncement in VLSI to discuss their mutual interests in defect-tolerant architectures and models for integrated circuit defects, faults, and yield. Progress in this area was slowed down by the proprietary nature of yield-related data, and by the lack of appropriate forums for disseminating such information. The goal of this workshop was therefore to provide a forum for a dialogue and exchange of views. A follow-up workshop in October 1989, with C. H. Stapper from IBM and V. K. Jain from the University of South Florida as general co-chairmen, is being organized. Seller Inventory # 9781461568018
Buy New
US$ 125.60
Convert currency
Stock Image
Defect and Fault Tolerance in VLSI Systems: Volume 1
Published by
Springer-Verlag New York Inc.
(2012)
ISBN 10: 1461568013
ISBN 13: 9781461568018
New
Paperback / softback
Quantity: 16
Seller:
Rating
Book Description Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days. Seller Inventory # C9781461568018
Buy New
US$ 149.95
Convert currency
Stock Image
Defect and Fault Tolerance in VLSI Systems: Volume 1
Seller:
Rating
Book Description Paperback. Condition: Brand New. reprint edition. 374 pages. 9.45x6.61x0.86 inches. In Stock. Seller Inventory # x-1461568013
Buy New
US$ 150.26
Convert currency