Digital Systems Testing & Testable Design - Hardcover
This updated printing of the leading text and reference in digital systems testing and testable design provides comprehensive, state-of-the-art coverage of the field. Included are extensive discussions of test generation, fault modeling for classic and new technologies, simulation, fault simulation, design for testability, built-in self-test, and diagnosis. Complete with numerous problems, this book is a must-have for test engineers, ASIC and system designers, and CAD developers, and advanced engineering students will find this book an invaluable tool to keep current with recent changes in the field.
"synopsis" may belong to another edition of this title.
From the Back Cover:
This widely-used textbook provides comprehensive, state-of-the-art coverage of digital systems testing and testable design.
About the Author:
Considered a definitive text in this area, the book includes in-depth discussions of the following topics:
Test generation
Fault modeling for classic and new technologies
Simulation
Fault simulation
Design for testability
Built-in self-test Diagnosis
All topics are covered extensively, from fundamental concepts to advanced techniques.
Successfully used world-wide at leading universities, the book is appropriate for graduate-level and senior-level undergraduate courses. Numerous examples and problems help make the learning process easier for the reader. Test engineers, ASIC and system designers, and CAD developers will find it an invaluable tool to keep current with recent changes in the field.
Miron Abramovici is a Distinguished Member of the Technical Staff at AT&T Bell Laboratories in Murray Hill, and an Adjunct Professor of Computer Engineering at the Illinois Institute of Technology in Chicago.
Melvin A. Breuer is a Professor of Electrical Engineering and Computer Science at the University of Southern California in Los Angeles.
Arthur D. Friedman is a Professor in the Department of Electrical Engineering and Computer Science at George Washington University.
All three authors are Fellows of the IEEE and have contributed extensively to the fields discussed in this book.
"About this title" may belong to another edition of this title.
- PublisherWiley-IEEE Press
- Publication date1994
- ISBN 10 0780310624
- ISBN 13 9780780310629
- BindingHardcover
- Edition number1
- Number of pages653
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Digital Systems Testing and Testable Design Abramovici, Miron; Breuer, Melvin A. and Friedman, Arthur D.
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