Product Type
Condition
Binding
Collectible Attributes
Free Shipping
Seller Location
Seller Rating
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: booksXpress, Bayonne, NJ, U.S.A.
Book
Hardcover. Condition: new.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Book
Condition: New.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Book Print on Demand
Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book.
Published by Springer US, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: Buchpark, Trebbin, Germany
Book
Condition: Gut. Gebrauchs- und Lagerspuren. AuÃ?en: verschmutzt, angestoÃ?en. Innen: Seiten eingerissen. 3028730/3 Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998.
Published by Springer US, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: moluna, Greven, Germany
Book Print on Demand
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Book Print on Demand
Hardback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
Published by Springer US, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: AHA-BUCH GmbH, Einbeck, Germany
Book
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.
Published by Springer US Apr 1998, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Book Print on Demand
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. 168 pp. Englisch.
Published by Springer, 1998
ISBN 10: 0792381327ISBN 13: 9780792381327
Seller: Mispah books, Redhill, SURRE, United Kingdom
Book
Hardcover. Condition: Like New. Like New. book.