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Bibliographic Details

Title: 1997 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems: October 20-22, 1997 Paris, France
Publisher: IEEE Computer Society
Publication Date: 1997
Language: English
ISBN 10: 0818681683
ISBN 13: 9780818681684
Binding: paperback
Condition: Good

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Papers from the 1997 IEEE International Symposium on Defect and Fault Tolerant in VLSI Systems.

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