2000 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft 2000)

IEEE Computer Society

ISBN 10: 0769507190 / ISBN 13: 9780769507194

Published by I.E.E.E.Press, 2000

About this Item

I.E.E.E.Press/ Computer Society 2000 paperback 422 pages full of statistics, minor shelfwear but this is A BRAND NEW BOOK UNUSED. Full refund if not satisfied. 24 hour despatch via Insured for. If not pictured in this listing, a scan of the actual book is available on request.

Seller Inventory # tla2862a

Bibliographic Details

• Title: 2000 IEEE International Symposium on Defect and Fault Tolerance in Vlsi Systems (Dft 2000)
• Publisher: I.E.E.E.Press
• Publication Date: 2000
• Language: English
• ISBN 10: 0769507190
• ISBN 13: 9780769507194
• Binding: Soft cover
• Condition: As New
• Seller catalogs:
  • Computers and IT

About this title

Synopsis

This volume includes 45 papers presented at the October 2000 symposium, covering yield analysis, modeling, and enhancement; fault tolerance interconnections and systems; reconfiguration and repair; error coding; online testing; testing and BIST techniques; and fault injection techniques and environments. The authors, professionals and academics from 18 different companies, offer papers on specific topics such as quality-effective repair of multichip module systems, evaluations of burst error recovery for VF arithmetic coding, and test cost minimization for Hybrid BIST. A thorough subject index is lacking. Annotation c. Book News, Inc., Portland, OR (booknews.com)