Items related to Semiconductor Measurements and Instrumentation
The definitive reference on semiconductor characterization tools! Here, in one well-organized volume, are detailed explanations of the advanced and "traditional") techniques for evaluating virtually every criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type. Reliable, high-accuracy methods of measuring hardness, stress, and various kinds of surface contamination are also included. In addition to its value as a practical everyday reference, the text also serves as an excellent user's guide to the latest methods of optical microscopy, scanning electron microscopy (SEM), electron microprobe analysis, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), scanning probe microscopy (SPM), and secondary ion mass spectrometry (SIMS). This is the only guide that offers such "dual coverage" of its topic -- in terms of both measurements and tools.
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From the Back Cover:
The definitive reference on semiconductor characterization tools! Semiconductor Measurements & Instrumentation, Second Edition. This fully updated edition of the classic reference incorporates all the new approaches and tools for semiconductor material characterization that have been developed to accomodate ever-shrinking semiconductor geometries. Here, in one well-organized volume, are detialed explanations of the advanced techniques for evaluating virtually every criterion: crystal defects, impurity concentration, lifetime, film thickness, resistivity, and such critical electrical properties as mobility, Hall effect, and conductivity type. Reliable, high-accuracy methods of measuring hardness, stress, and various kinds of surface contamination are also included. In addition to its value as a practical everyday reference, the text also serves as an excellent user's guide to the latest methods of optical microscopy, scanning electron microscopy (SEM), electron microprobe analysis, transmission electron microscopy (TEM), Auger electron spectroscopy (AES), scanning probe microscopy (SPM), and secondary ion mass spectrometry (SIMS). As the only guide that offers such "dual coverage" of its topic--in terms of both measurements and tools--and this timely and thorough reference is sure to be of considerable ongoing benefit to solid state and semiconductor engineers.
About the Author:
W. R. Runyan (Dallas, TX) has nearly 30 years of experience in industrial semiconductor processing. T. J. Shaffner (Dallas, TX) is manager of the Materials Characterization Branch in Corporate R&D for Texas Instruments.
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- PublisherMcGraw-Hill Professional
- Publication date1998
- ISBN 10 0070576971
- ISBN 13 9780070576971
- BindingHardcover
- Edition number2
- Number of pages454
- Rating
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Semiconductor Measurements and Instrumentation
Published by
McGraw-Hill Professional Publishing
(1998)
ISBN 10: 0070576971
ISBN 13: 9780070576971
Used
Hardcover
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Book Description Condition: Good. 2. Good+; Hardcover; 2nd Edition; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); 1.9 lbs; Purple, blue, and black covers with title in white lettering; 1998, McGraw-Hill Professional Publishing; 454 pages; "Semiconductor Measurements and Instrumentation," by W. R. Runyan, et al. Seller Inventory # SKU-1160AG03603104
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