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Synopsis
X-Ray Diffraction Topography presents an elementary treatment of X-ray topography which is comprehensible to the non-specialist. It discusses the development of the principles and application of the subject matter. X-ray topography is the study of crystals which use x-ray diffraction. Some of the topics covered in the book are the basic dynamical x-ray diffraction theory, the Berg-Barrett method, Lang’s method, double crystal methods, the contrast on x-ray topography, and the analysis of crystal defects and distortions. The crystals grown from solution are covered. The naturally occurring crystals are discussed. The text defines the meaning of melt, solid state and vapour growth. An analysis of the properties of inorganic crystals is presented. A chapter of the volume is devoted to the characteristics of metals. Another section of the book focuses on the production of ice crystals and the utilization of oxides as laser materials. The book will provide useful information to chemists, scientists, students and researchers.
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X-Ray Diffraction Topography
Seller: Anybook.com, Lincoln, United Kingdom
Seller rating 5 out of 5 stars
Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,600grams, ISBN:0080196926. Seller Inventory # 9511029
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X-Ray Diffraction Topography
Seller: -OnTimeBooks-, Phoenix, AZ, U.S.A.
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Condition: very_good. Gently read. May have name of previous ownership, or ex-library edition. Binding tight; spine straight and smooth, with no creasing; covers clean and crisp. Minimal signs of handling or shelving. 100% GUARANTEE! Shipped with delivery confirmation, if you're not satisfied with purchase please return item! Ships USPS Media Mail. Seller Inventory # OTV.0080196926.VG
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X-Ray Diffraction Topography.
Seller: Antiquariat Silvanus - Inhaber Johannes Schaefer, Ahrbrück, Germany
Seller rating 5 out of 5 stars
174 S. mit zahlreichen Abbildungen, (174 pp. with a lot of figures), 0080196926 Sprache: Englisch Gewicht in Gramm: 550 Gr.-8°, Original-Pappband (Hardcover), Einband leicht lichtrandig, insgesamt gutes und innen sauberes Exemplar, (caover slightly sunned, good coppy), Seller Inventory # 53702
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X-Ray Diffraction Topography. Tanner, B.K.
Seller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
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Condition: gut. 1976. X-Ray Diffraction Topography. In englischer Sprache. pages. Seller Inventory # BN134644
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