As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
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Dr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits.
--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories
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Book Description Academic Press, 1990. Hardcover. Book Condition: New. Bookseller Inventory # DADAX0122341228