Synopsis
As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.
Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification
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Review
Dr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits.
--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories
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Vlsi Reliability
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Vlsi Reliability (V L S I ELECTRONICS), VLSI electronics microstructure Science. Vol. 22
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VLSI electronics microstructure Science. Vol. 22 : VLSI Reliability
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Academic Press, San Diego, 1990
ISBN 10: 0122341228
ISBN 13: 9780122341229
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Original Cloth. 1st Edition. 23 x 15 cm., xiii, 207 pp. The book is covered in green cloth with black lettering on the spine and front. CONDITION. VG+/ no dj. The pages are clean and tight. Slight rubbing of corners and ends of the spine. Library marks and labels on spine and front end papers. Label on free end paper has caused wrinking. Library stamp on fore edge. Ex-Library. Seller Inventory # 002759
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