VLSI Electronics: Microstructure (Volume 22) (VLSI Electronics Microstructure Science, Volume 22) - Hardcover

Sabnis, Anant G.

 
9780122341229: VLSI Electronics: Microstructure (Volume 22) (VLSI Electronics Microstructure Science, Volume 22)

Synopsis

As integrated cicuits become more complex, with smaller and smaller geometries, much more care must be taken to avoid reliability problems. This practical volume covers a broad spectrum of reliability issues in integrated circuits, from basic concepts to packaging.

Topics include:**failure analysis techniques**radiation effects**reliability assurance and qualification

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Review

Dr. Sabnis has provided a broad overview of the major failure mechanisms afflicting modern semiconductor devices, and he has compiled a carefully selected list of references for each subject. He has also summarized many of the methods developed over time to evaluate reliability of these devices. I strongly recommend this book to all those*bMboth neophytes and experts*bMinvolved in the design, fabrication, and application of integrated circuits.
--From the Foreword by Carl W. Green, Head, IC Test Technology, AT&T Bell Laboratories

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