Principles of Electron Optics, Volume 1 - Softcover

P. W. Hawkes; E. Kasper

 
9780123333414: Principles of Electron Optics, Volume 1

Synopsis

This set is a reprint of the acclaimed three-volume series, Principles of Electron Optics which represents the first and only comprehensive treatment of electron optics in over forty years. Each volume focuseson different aspects of Electron Optics, but together these three volumes cover systematically the whole of the subject, making this complete set an indispensable resource for anyone involved in the field of Optics.
Volumes One and Two are devoted to geometrical optics, covering classical mechanics; calculation of static fields; the paraxial approximation; aberrations; deflection systems; computer-aided electro-optics; instrumental optic aberration correctionand beam intensity distribution; electron guns; and systems with a curved optic axis. Volume Three covers wave optics and effects due to wave length, and deals with wave mechanics; electron interference and electron holography; theory of image formation; electron interactions in thin specimens; digital image processing; and coherence, brightness and spectral functions.
Together these three volumes comprise a resource which has been called"...the definitive text and source book in the field..."(K.C.A. Smith, ROYAL MICROSCOPY SOCIETY REVIEW)

Key Features
* The most comprehensive coverage of the field in over forty years
* Contains extensive references and notes containing the contents of many of the major papers cited in the text
* Covers every significant advance in Electron Optics since the subject originated
* Exceptionally complete and carefully selected references

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From the Back Cover

The electron microscope is a viral tool in materials science and in the lige sciences. The images observed can only be interpreted with confidence in the image-forming process is throughly understood. In the third volume, Principles of Electron Optics, the wave optics that enables us to explain the relationship between umage and specimen, especially at high resolution, is presented in detail. Image formation in the electron microscop and electron holography are fully explored and a long section is devoted to methods of processing images with the aid of the computer, to extract all possible information. For completenes, a brief account of beam-specimen interactions in both crystalline and amorphous objects is included and recent ideas about coherence, not hitherto examined in connection with electron microscopy, are summarized.

The bibliography, drawn from widely scattered literature of all these topics, is exceptionally comprehensive.

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