VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)

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9780123705976: VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon)
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This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

  • Most up-to-date coverage of design for testability.
  • Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. 
  • Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

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Book Description:

The most up-to-date coverage available of VLSI Testing and Design-for-Testability!

About the Author:

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Kwang-Ting (Tim) Cheng, Ph.D., is a Professor and Chair of the Electrical and Computer Engineering Department at the University of California, Berkeley. A Fellow of the IEEE, he has published over 300 technical papers, co-authored three books, and holds 11 U.S. Patents.

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9781493300860: VLSI Test Principles and Architectures: Design for Testability

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