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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 162) (Advances in Imaging and Electron Physics, Volume 162) - Hardcover
Synopsis
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
- Contributions from leading international scholars and industry experts
- Discusses hot topic areas and presents current and future research trends
- Invaluable reference and guide for physicists, engineers and mathematicians
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About the Author
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 162)
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Advances in Imaging and Electron Physics, Vol. 162
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ADVANCES IN IMAGING AND ELECTRON PHYSICS: VOLUME 162 : OPTICS OF CHARGED PARTICLE ANALYZERS
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Advances in Imaging and Electron Physics, Vol. 162
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Advances in Imaging and Electron Physics, Vol. 162
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (Volume 162) (Advances in Imaging and Electron Physics, Volume 162)
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Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers: Volume 162
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Advances in Imaging and Electron Physics: Volume 162: Optics of Charged Particle Analyzers (Advances in Imaging & Electron Physics)
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Academic Press 2010-08-06, 2010
ISBN 10: 0123813166
ISBN 13: 9780123813169
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Advances in Imaging and Electron Physics
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Elsevier Science & Technology, Academic Press, 2010
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. Englisch. Seller Inventory # 9780123813169
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