Digital Circuit Testing: A Guide to DFT and Other Techniques - Softcover

Wong, Francis C.

Softcover

ISBN 10: 0123959128 ISBN 13: 9780123959126

Publisher: Academic Press, 2016

Synopsis

Recent technological advances have created a testing crisis in the electronics industry-smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

Edition details

• Publisher: Academic Press
• Publication date: 2016
• Language: English
• ISBN 10: 0123959128
• ISBN 13: 9780123959126
• Binding: Paperback
• Number of pages: 248